- Trusted SellerMake Offer
Cascade Microtech Summit 12000B
used
- Manufacturer: Cascade Microtech
- Model: Summit
Prober Station, Maker Cascade Microtech, Model Summit 12000B; to include 1ea Rack, 1ea Keysight '34980A' Data Acquisition System, 6ea Advantest 'AD7461A' Multimeters, 1ea att Control Unit, 1ea Anritsu 'MP1761B' P...
Hachioji, JapanVisit Auction Website - Trusted SellerMake Offer
Cascade Microtech Summit 12000B
used
- Manufacturer: Cascade Microtech
- Model: Summit
Prober Station, Maker Cascade Microtech, Model Summit 12000B; to include 1ea Rack, 1ea Agilent '8722ES' Network Analyzer, 7ea Advantest 'R6243' Current Sources, 3ea Advantest 'TR6143' Current Sources, 1ea Cascade...
Hachioji, JapanVisit Auction Website - Trusted SellerMake Offer
Cascade Microtech Summit 12000B
used
- Manufacturer: Cascade Microtech
- Model: Summit
Prober Station, Maker Cascade Microtech, Model Summit 12000B; to include 1ea Rack, 10ea Agilent '34401' Multimeters, 1ea Keysight '34980A' Data Acquisition System, 2ea ADCMT '6240A' Current Sources, 6ea ADCMT '62...
Hachioji, JapanVisit Auction Website - Trusted Seller
TRI TR7700QE AOI Machine
new
Imaging Speed:12 Mpix@ 10 µm: 13.5 cm²/sec The TR7700QE AOI offers high performance 3D solder and assembly inspection by combining the next generation 2D and 3D technologies based on 4-way adaptive digital fringe...
Shenzhen, China - Trusted Seller
TRI TR7500QE AOI Machine
new
Imaging Speed:12 Mpix@ 10 µm: 13.5 cm²/sec Max PCB Size:TR7500QE: 510 x 460 mm The TR7500QE AOI offers high performance 3D solder and assembly inspection by combining the next generation multi-angle 2D and 3D tec...
Shenzhen, China - Trusted Seller
ADVANTEST T5585
used
- Manufacturer: Advantest
- Model: T5585
ADVANTEST T5585 Wafer size: 200mm Please download the PDF file below for pictures: Advantest T5585 Advantest Memory Tester VINTAGE 2002 MAKER Advantest MODEL T5585 PROCESS Memory Tester 1152 Channel 250 ...
Asia HGTECH Defect Detection Series Semiconductor Substrate Defect Detection Equipment
new
- Manufacturer: Hgtech
Product advantages: Suitable for 4-8 inch wafers, substrates, epitaxial wafers and patterned wafers Detect particles, pits, bumps, scratches, stains, cracks and other defects System resolution: 1-10 μ m No patter...
Wuhan, ChinaHGTECH Wafer Defect Detection Series Semiconductor Wafer Defect Detection Equipment
new
- Manufacturer: Hgtech
Product advantages: This equipment can be used for 4-8 inch patterned wafers Detect defects such as scratch, back collapse, color difference, crack, scratch, metal residue and metal loss System resolution: 0.2-0....
Wuhan, China