- Trusted Seller
Altek Process Voltage Analyzer
used
- Manufacturer: Altek
Trim, Ireland KLA-Tencor AIT I (8020)
used
- Manufacturer: KLA-Tencor
- Model: AIT I
A double darkfield patterned wafer inspection tool. Features: Automated wafer inspection system Double-dark field (DDF) laser scanning technology High detection sensitivity even for difficult after-etch, develop,...
San Jose, CAZeiss/HSEB Axiospect 300 Automated Wafer Inspection and Review station for 200mm/300mm wafers
used
- Manufacturer: HSEB
Wafer inspection/review station for bare and patterned wafers Inspect 300mm wafers in FOUP loaders or 200mm wafers in open cassetes with adaptors 2 FOUP loaders Axiotron 300 microscope Equipe robot with PRE-5...
KLA-Tencor Surfscan 7700 Wafer Inspection System
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 7700
A patterned and unpatterned wafer inspection and can accommodate wafers between 4" to 8". Features: High sensitivity on after-ech and high topography applications Dual collection channels Circular input polarizat...
San Jose, CAKLA-Tencor AIT I In-Line Defect Inspection System
used
- Manufacturer: KLA-Tencor
- Model: AIT I
Automated full water inspection system for detecting particles as small as 0.10 micrometers on bare silicon and patterned process wafers Features: High detection sensitivity even for difficult after-etch, develop...
San Jose, CATeradyne Optima 7300 AOI – Automatic Optical Inspection System – For Parts or Repair
used
- Manufacturer: Teradyne
- Model: OPTIMA 7300
PRODUCT DESCRIPTION: Teradyne Optima 7300 Automated Optical Inspection (AOI) system, designed for post-reflow inspection on high-capacity SMT lines. This model was recognized for its high speed and accuracy, capa...
$4,500 USDTijuana, Mexico- Trusted Seller
Tencor M-Gage DDC for printer interface
used
- Manufacturer: KLA-Tencor
Tencor M-Gage DDC for printer interface (EQP-10285) Tencor M-Gage DDC for printer interface
Rocklin, CA - Trusted Seller
HTC 4000, 8000 Omron controller - Fully tested
used
- Manufacturer: Omron
HTC 4000, 8000 Omron controller - Fully tested (EQP-10395) HTC 4000, 8000, Omron controller - Fully testedHTC 4000, 8000, software optional.
Rocklin, CA - Trusted Seller
Keysight (Agilent) 4155B
used
- Manufacturer: Agilent - Keysight
- Model: 4155B
Semiconductor Parameter Analyzer The 4155B Semiconductor Paramer Analyzer is used to evaluate materials with measurements to 1 fA and 1 µV, automatically extract process parameters without manually manipulating ...
Cary, NC ERSA PL550A
used
- Manufacturer: Ersa
ERSA - PL550A - Placement system with camera SMD precision placement system with integrated x/y PCB table reflow process camera VSRPC with swivel arm dimmable LED ring light 230 V - 20 W
Farmingdale, NJAgilent/Keysight N2502B
used
- Manufacturer: Agilent - Keysight
Key Features: Shorten TACT (total average cycle time) with the industry-highest speed TFT array test function Utilize flexible and unlimited channel expandability to maximize ROI (return on investment) Customize ...
Farmingdale, NJ- Trusted Seller
Tektronix 370B
used
- Manufacturer: Tektronix
- Model: 370B
Programmable Curve Tracer The Tektronix 370B is a Programmable Curve Tracer. Tektronix curve tracers offer power and versatility to test the DC characteristics of semiconductor devices. The 370B and 371B curve tr...
Cary, NC - Trusted Seller
KLA-Tencor Surfscan SP1 DLS Unpatterned Surface Inspection System
used
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
KLA-TENCOR SURFSCAN SP1 DLS UNPATTERNED SURFACE INSPECTIONSYSTEM consisting of:- Model: SP1 DLS with 300mm Single FOUP/FIMS Handler (other handlers available)- Currently Configured for 200/300mm Wafers - Unpatter...
Decatur, GA KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM W/ 4200 SMU
used
- Manufacturer: Keithley
- Model: 4200
Information: 1) KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM 3) 4200 SMU CARDS The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time...
Santa Barbara, CATektronix 4225-PMU
used
- Manufacturer: Tektronix
- Model: 4225-PMU
Ultra-fast I-V sourcing and measuring have become increasingly important capabilities for many technologies, including compound semiconductors, medium power devices, non-volatile memory, MEMS devices and more. Th...