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Used processing

  • Trusted Seller
    2003 TEL P12XL

    2003 TEL P12XL

    • Manufacturer: Tokyo Electron - TEL
    • Model: P-12XL

    TEL, P12XL, 300mm Tool Status Connected Wafer Size 300 mm Fab Section Test Asset Description TEL P12XL Prober Software Version Standard CIM SECS GEM Process TEST Main System LA08 Prober 1 Factory Interfa...

    United States
  • Trusted Seller
    2004 TEL P12XL

    2004 TEL P12XL

    • Manufacturer: Tokyo Electron - TEL
    • Model: P-12XL

    TEL, P12XL Prober, 300mm, TEL P12XL Prober single foup VIP3A Tool Status Disconnected Wafer Size 300 mm Fab Section Test Asset Description TEL P12XL Prober single foup VIP3A Software Version Rby00-R016.02U1 ...

    United States
  • Trusted Seller
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    TEL P-12XLM

    • Manufacturer: Tokyo Electron - TEL
    • Model: P-12XLM

    TEL P-12XLM Wafer size: 300MM Process: ATE

    Trim, Ireland
  • Trusted Seller
    no-image_en.png

    2012 TEL Precio Nano

    • Manufacturer: Tokyo Electron - TEL
    • Model: Precio

    Wafer size: 300mm Process: test - Chuck Type : Air-Cool - Chuck Surfave : Gold - Docked Tester : IP750EX - OCR : Yes - FFU : Yes

    Asia
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    2011 TEL PRECIO

    • Manufacturer: Tokyo Electron - TEL
    • Model: Precio

    Manufacturing process: ATE

    Tokyo, Japan
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    2012 TEL Precio octo

    • Manufacturer: Tokyo Electron - TEL
    • Model: Precio

    Manufacturing process: ATE | Inch: 8

    Tokyo, Japan