285714 / PCB DPB DATA PROCESSING BOARD S8000 AIT1 WITH EXCHANGE / KLA TENCOR
- Manufacturer: KLA-Tencor
- Model: AIT
“SOLD AS IS, WHERE IS ***NO WARRANTY***” Mpn: 285714
375039 / PCB, DATA PROCESS BOARD AIT 2, SLOT S1-S2, W-EXCHANGE / KLA TENCOR
- Manufacturer: KLA-Tencor
- Model: AIT
“***WITH EXCHANGE MEANS WE NEED ONE BACK FROM YOU FOR OUR REPAIR LOOP, AS WE REPAIR THESE ITEMS IN HOUSE. *** DO NOT PURCHASE OR BID ON THIS IF YOU DO NOT HAVE ONE TO RETURN FOR REPAIR. ***SOLD AS IS WHERE IS ***...
- Trusted Seller
KLA-Tencor 740-22103-001 Chuck Assembly eS31 E-Beam Wafer Inspection Working
- Manufacturer: KLA-Tencor
“Removed from a KLA-Tencor eS31 E-Beam Wafer Inspection System” KLA-Tencor 740-22103-001 Chuck Assembly eS31 E-Beam Wafer Inspection Working Inventory # 21039 Rev. AA Removed from a KLA-Tencor eS31 E-Beam Wafer I...
$1,504 USDAlbuquerque, NM 
KLA-Tencor Surfscan 7600 Particle Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 7600
A particle inspection tool - capable of up to 200mm wafers. Specifications:
San Jose, CA
KLA-TENCOR SURFSCAN 6220 (SFS 6220)
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-Tencor Surfscan 6220 (SFS 6220) Wafer Surface Contamination Analysis System The SFS 6220 tool is used for wafer surface contamination analysis of unpatterned semiconductor wafers. System is calibrated, tes...
- Trusted Seller
KLA AIT II system
- Manufacturer: KLA-Tencor
- Model: AIT II
Wafer size: 6" It is complete and has no known issues OEM Model Description The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool perf...
United States - Trusted Seller
2006 KLA eS32 e-beam wafer inspection 200mm
- Manufacturer: KLA-Tencor
KLA eS32 E-beam Wafer Inspection 200mm eS32 is a top-of-the-line mask and wafer inspection equipment that is designed to meet the most stringent quality standards for semiconductor product manufacturing. This sy...
United States - Trusted Seller
KLA-Tencor Corp. Surfscan SP2.5+
- Manufacturer: KLA-Tencor
- Model: Surfscan SP2
Particle Measurement Metrology Equipment Currently Configured for: 300mm · Defect Inspection · Two Load Ports · SECS/GEM Capability · Integration to Klarity/UDB · Auto DSA · High resolution 3D imaging of ...
United States 
KLA-Tencor Model AIT XP Darkfield Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT XP
The KLA-Tencor AIT XP+ Patterned Wafer Inspection system is designed to meet the needs of 0.13um and beyond design rule processes. Based on the highly popular AIT series, the AIT XP+ incorporates Mixed Mode Detec...
San Jose, CA
KLA-Tencor AIT I (8020)
- Manufacturer: KLA-Tencor
- Model: AIT I
A double darkfield patterned wafer inspection tool. Features: Automated wafer inspection system Double-dark field (DDF) laser scanning technology High detection sensitivity even for difficult after-etch, develop,...
San Jose, CA
KLA-Tencor Surfscan 7700 Wafer Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 7700
A patterned and unpatterned wafer inspection and can accommodate wafers between 4" to 8". Features: High sensitivity on after-ech and high topography applications Dual collection channels Circular input polarizat...
San Jose, CA
KLA-Tencor AIT I In-Line Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT I
Automated full water inspection system for detecting particles as small as 0.10 micrometers on bare silicon and patterned process wafers Features: High detection sensitivity even for difficult after-etch, develop...
San Jose, CA- Trusted Seller
KLA-Tencor Surfscan SP1 DLS Unpatterned Surface Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
KLA-TENCOR SURFSCAN SP1 DLS UNPATTERNED SURFACE INSPECTIONSYSTEM consisting of:- Model: SP1 DLS with 300mm Single FOUP/FIMS Handler (other handlers available)- Currently Configured for 200/300mm Wafers - Unpatter...
Decatur, GA - Trusted SellerBree, Ireland
- Trusted Seller
KLA-Tencor Surfscan SP1 DLS
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
KLA-Tencor Surfscan SP1 DLS The Surfscan SP1 DLS unpatterned wafer inspection system captures yield-limiting defects down to 50nm at high throughput, to accelerate yield learning rates across all process modules ...
Bree, Ireland
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