Used Test & Measurement (Semiconductors) in China

High precision AOI inspection machine

Suitable for high-end automatic SMT production line, real-time online AOl inspection; More efficient automation, no need to manually release the board More efficient automation, no need to manually release the bo...

AOI repair machine for PCB board

AOI repair machine has a high precision to ensure stability and efficiency of operation. Technical specification

Keysight Used 4155C Semiconductor Parameter Analyzer (Agilent 4155C) Price negotiable

• Manufacturer: Agilent - Keysight
• Model: 4155C

Keysight Used 4155C Semiconductor Parameter Analyzer (Agilent 4155C) Price negotiable General Product Information The Keysight 4155C Semiconductor Parameter Analyzer is a cost-effective, accurate laboratory bench...

Semi-Automatic Wafer Prober Station

Product Introduction X series is a semi-automatic probe station that integrates electrical, light wave, microwave, and other testing functions. IProfessionally respond to the performance test of advanced chips of...

HGTECH Defect Detection Series Semiconductor Substrate Defect Detection Equipment

• Manufacturer: Hgtech

Product advantages: Suitable for 4-8 inch wafers, substrates, epitaxial wafers and patterned wafers Detect particles, pits, bumps, scratches, stains, cracks and other defects System resolution: 1-10 μ m No patter...

HGTECH Wafer Defect Detection Series Semiconductor Wafer Defect Detection Equipment

• Manufacturer: Hgtech

Product advantages: This equipment can be used for 4-8 inch patterned wafers Detect defects such as scratch, back collapse, color difference, crack, scratch, metal residue and metal loss System resolution: 0.2-0....

High And Low Temperature Prober

Product Introduction HLTP-C series prober has an excellent mechanical system, stable structural performance, intuitive, easy operation, support multi-function upgrade, and rich and compre-hensive functions. This ...

High And Low Temperature Vacuum Prober

Product Introduction MDSM-VP-CG series probe station can provide IV/CV characteristic test, RF test, photoelectric test, electromagnetic transport characteristic, and Hall effect test for device and material char...

Panel Laser Prober

Application Direction TEG Electrical testing of OLED/T FT-LCD panels Product Introduction The MDSM-TEG series panel laser probe is mainly used to analyze the TEG circuit of LCD screens, test electrical parameters...

Fully Automatic Mass Production Wafer Prober

Product Introduction MDSM-FA8 is a new high-power prober with a temperature range from room temperature to +200 °C and supports the measurement of high voltage 3 kV (Tri-axis)/10 kV (coaxi-al) and 500A. It can te...

Failure Analysis Wafer Prober

Product Introduction MDSM-FA series prober is a measuring equipment specially designed for failure analysis laboratory. It has optical and laser characteristics, stable equipment structure, excellent system perfo...

MP-E Series manual prober

Product Introduction The MP-E series is a functionally advanced probe station, which can examine the electrode/pad size of more than 1μm and can upgrade with test functions at a lower cost. Product Features 1.Chu...

MP-M Series manual prober

Product Introduction If your test PAD is larger than 30µm, the MP-M Series is one of your first choice in the lab. Product Features 1.Upgrade able Modular design 2.Various modules can be selected according to tes...

MP-H Series manual prober

Product Introduction The MP-H series probe station is suitable for R&D labora-tories, allowing them to invest their budget once.The chuck movement technology can meet your needs for efficient testing of the entir...

I.C.T- FAI1095 SMT Online First Article Inspection Machine

Overview Overview SMT Online First Article Inspection Machine Introduction: I.C.T-FAI1095 is an advanced PCBA full-automatic flying probe test first article tester. It subverts the traditional manual material cla...

Agilent - Keysight 4155A Test & Measurement (semiconductors)

• Manufacturer: Agilent - Keysight
• Model: 4155A

Good condition Agilent - Keysight 4155A Test & Measurement (semiconductors)s manufactured in 2005. Located in USA and other countries. Click request price for more information.