- Trusted Seller
Kensington Laboratories Q2SL 200mm Wafer Inspection Stage XYZ Spare Surplus
used
- Manufacturer: Kensington Laboratories
Kensington Laboratories Q2SL 200mm Wafer Inspection Stage XYZ Spare Surplus This Kensington Laboratories Q2SL 200mm Wafer Inspection Stage is used working surplus. The physical condition is good, but there are si...
$1,502 USDAlbuquerque, NM - Trusted Seller
Hine Design 03365-005 200mm Wafer Indexer Lift Loader Nikon OPTISTATION 3 Spare
used
- Manufacturer: Nikon
- Model: Optistation III
“Removed from a Nikon OPTISTATION 3 200mm Automatic Wafer Inspection System” Hine Design 03365-005 200mm Wafer Indexer Lift Loader Nikon OPTISTATION 3 Spare Removed from a Nikon OPTISTATION 3 200mm Automatic Wafe...
$503 USDAlbuquerque, NM - Trusted Seller
Nikon 2B002-023 Arched Holder End Effector OPTISTATION 7 300mm Working Spare
used
- Manufacturer: Nikon
- Model: Optistation VII
“Removed from a Nikon OPTISTATION 7 300mm Automatic Wafer Inspection System” Nikon 2B002-023 Arched Holder End Effector OPTISTATION 7 300mm Working Spare Inventory # A-17931 Removed from a Nikon OPTISTATION 7 300...
$1,007 USDAlbuquerque, NM - Trusted Seller
Hine Design 03365-008 200mm Wafer Indexer Lift Loader Nikon OPTISTATION 3 Spare
used
- Manufacturer: Nikon
- Model: Optistation III
“Removed from a Nikon OPTISTATION 3 200mm Automatic Wafer Inspection System” Hine Design 03365-008 200mm Wafer Indexer Lift Loader Nikon OPTISTATION 3 Spare Removed from a Nikon OPTISTATION 3 200mm Automatic Wafe...
$503 USDAlbuquerque, NM - Trusted Seller
Zeiss/HSEB Axiospect 300 Automated Wafer Inspection and Review station for 200mm/300mm wafers
used
- Manufacturer: HSEB
Wafer inspection/review station for bare and patterned wafers Inspect 300mm wafers in FOUP loaders or 200mm wafers in open cassetes with adaptors 2 FOUP loaders Axiotron 300 microscope Equipe robot with PRE-5...
United States - Trusted Seller
KLA-Tencor Corp. Surfscan SP2.5+
used
- Manufacturer: KLA-Tencor
- Model: Surfscan SP2
Particle Measurement Metrology Equipment Currently Configured for: 300mm · Defect Inspection · Two Load Ports · SECS/GEM Capability · Integration to Klarity/UDB · Auto DSA · High resolution 3D imaging of ...
United States - Trusted Seller
RUDOLPH FE-VII-D, Focus Ellipsometer
used
- Manufacturer: Rudolph
RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...
United States - Trusted Seller
Tencor Surfscan 7200
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 7200
Tencor Surfscan 7200 (Surfscan 7200) Sensitivity: 0.4 um. Substrate size: 4" to 8". Scan modes: Pattern viewing, particle viewing, and microscan viewing modes. Note: You can view the ...
Rocklin, CA 
ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM
used
- Manufacturer: Orbotech
INFORMATION: ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM MODEL: FPI-7092 M SERIAL NO: SF 021005 DATE OF MFG: 06-2002 VOLTAGE: 120 VAC AMP: 32A FREQUENCY: 50/60 HZ The Orbotech FPI-7092 System is an AOI ...
Santa Barbara, CA- Trusted Seller
Tencor Surfscan 6220
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
Tencor Surfscan 6220 (Surfscan 6220) Tencor 6220 Particle Counter* Capable of 2" -8" wafers* Non-patterned Surface Inspection System* .09 micron defect sensitivity @ 80% capture, based on PSL Standards. * 0...
Rocklin, CA - Trusted Seller
Trim, Ireland - Trusted SellerTrim, Ireland
- Trusted Seller
Tencor Surfscan 7700M
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 7700
Tencor Surfscan 7700M (Surfscan 7700) Patterned Wafer Inspection System. Can detect defects as small as 0.15 ¿m, while defects below 0.2 ¿m can be detected on many process levels, inc...
Rocklin, CA - Trusted Seller
Tencor Surfscan 5500
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 5500
Tencor Surfscan 5500 (Surfscan 5500 Particle Counter) Tencor 5500 Wafer Particle Counter * Measures surface contamination on unpatterned wafers from 100mm to 200mm diameter. * Detects particles as small as ...
Rocklin, CA 
KLA-Tencor Model AIT XP Darkfield Inspection System
used
- Manufacturer: KLA-Tencor
- Model: AIT XP
The KLA-Tencor AIT XP+ Patterned Wafer Inspection system is designed to meet the needs of 0.13um and beyond design rule processes. Based on the highly popular AIT series, the AIT XP+ incorporates Mixed Mode Detec...
San Jose, CA
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