Used Defect Inspection

Hitachi S 4500 Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-4500

HITACHI SU-70

• Manufacturer: Hitachi
• Model: SU70

Hitachi SU-70, Ultra-high resolution analytical Scanning Electron Microscope SEM Model SU-70 is a new-concept SEM, incorporating Hitachi’s field proven semi-in-lens technology for ultra-high resolution with a Sc...

Hitachi S 3000 N Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-3000N

- Variable Pressure (Low Vacuum) - 6" Stage - Windows XP Operating System - HP DC 7600 - Software Options: - Measurement - PCI Interface (Image management) - H.R. Image Memory - SEM Data Management - Ful...

2005 HITACHI S 3400 N Variable Pressure SEM

• Manufacturer: Hitachi
• Model: S-3400N

Still installed

1998 Hitachi S 5000 Field Emission Scanning Electron Microscope

• Manufacturer: Hitachi
• Model: S-5000

- Ultra High Resolution - Accelerating Voltage: 30 kV - Magnification: 500,000x Performance - Image Resolution: 0.6 nm (at 30 kV),3.5 nm (at 1 kV) in secondary electron image Magnification - Low mag mode: x...

1997 Hitachi S-4500 II Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-4500

- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guaranteed (at accelerating voltage 1 kV, working distance 3mm) Magnification: ...

1997 Hitachi S-4500 II Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-4500

- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guaranteed (at accelerating voltage 1 kV, working distance 3mm) Magnification: ...

Hitachi S-5500

• Manufacturer: Hitachi
• Model: S-5500

Process Type: FA SEMs/TEMs/Dual Beams Specifications: Secondary Electron image resolution: 0.4nm at 30kV and 1.6nm at 1kV Specimen Stage Stage Traverse: X: +3.5mm, Y: +2.0mm, Z:+0.3mm, T: +40 degrees Sample ...

HITACHI SU8040 Scanning Electron Microscope

• Manufacturer: Hitachi
• Model: SU8040

Hitachi SU8040 Scanning Electron Microscope, is a high-quality SEM used in various industries, research, and educational settings for imaging and analyzing the surface of specimens at high resolution. Nanotechno...

HITACHI S-4700 Type II Scanning Electron Microscope: Parts only

• Manufacturer: Hitachi
• Model: S-4700

Experience the precision and power of the Hitachi S-4700 Type II Scanning Electron Microscope, a versatile tool essential for detailed material analysis. The upright microscope structure allows for comfortable op...

HITACHI S-3400N Scanning Electron Microscope

• Manufacturer: Hitachi
• Model: S-3400N

The Hitachi S-3400N Variable Pressure SEM has been developed by improving the design of the S-3000N VP SEM which has been well accepted in the world market. It allows the study of wet, oily and/or non-conductive ...

1994 Hitachi S 4500 SEM

• Manufacturer: Hitachi
• Model: S-4500

Hitachi S 4700 Scanning Electron Microscope

• Manufacturer: Hitachi
• Model: S-4700

SEM

Hitachi S-4800-II

• Manufacturer: Hitachi
• Model: S-4800

Vintage: 2004/2007 Process Type: FA SEMs/TEMs/Dual Beams Status of Equipment: Refurbished Specification: Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.4nm (1kV, WD=1.5mm, Deceleration mode) 2...