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Used Metrology / Inspection (Semiconductors) in Japan

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    NANOMETRICS VERTEX-SM-110

    • Manufacturer: Nanometrics
    • Model: VERTEX-SM-110

    Manufacturing process: examination

    Tokyo, Japan
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    HITACHI S-8620

    • Manufacturer: Hitachi

    Manufacturing process: examination | Inch: 6

    Tokyo, Japan
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    2007 HITACHI CG-4000

    • Manufacturer: Hitachi

    Manufacturing process: examination | Inch: 12

    Tokyo, Japan
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    2008 HITACHI CG-4000

    • Manufacturer: Hitachi

    Manufacturing process: examination | Inch: 12

    Tokyo, Japan
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    JEOL 6380LV

    • Manufacturer: Jeol

    Manufacturing process: examination

    Tokyo, Japan
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    2008 UNIHITE SYSTEM XVA-160

    • Manufacturer: UNIHITE SYSTEM

    Manufacturing process: examination | Inch: square base

    Tokyo, Japan
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    VEECO ULTRAMET100

    • Manufacturer: Veeco - Sloan

    Manufacturing process: examination

    Tokyo, Japan
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    KLA TENCOR P-22 （C to C）

    • Manufacturer: KLA-Tencor

    Manufacturing process: examination | Inch: 8

    Tokyo, Japan
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    2007 NANOMETRICS RPM Sigma

    • Manufacturer: Nanometrics

    Manufacturing process: examination | Inch: 6

    Tokyo, Japan
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    HITACHI S-4700

    • Manufacturer: Hitachi
    • Model: S 4700

    Manufacturing process: examination

    Tokyo, Japan
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    HITACHI S-9260A

    • Manufacturer: Hitachi
    • Model: S-9260A

    Manufacturing process: examination | Inch: 8

    Tokyo, Japan
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