Building Filters
Tokyo, Japan
Hitachi High-Tech Hitachi High-Tech S-3500N
- Model: S-3500N
Model year: February 2002 Specification: EMAX malfunction
2002 Hitachi High-Tech Hitachi High-Tech S-3500N
- Model: S-3500N
emax failure Device name: Scanning electron microscope (SEM)
Hitachi S-2600H
- Manufacturer: Hitachi
- Model: S-2600H
Device name: Scanning electron microscope (SEM) | Remarks: PC startup not possible
Hitachi High-Tech Hitachi High-Tech S-3700N
- Manufacturer: Hitachi
- Model: S-3700N
Device name: Scanning electron microscope (SEM)
Tokyo, Japan
Hitachi High-Technologies S-2600H
- Model: S-2600H
With EMAX Device name: Scanning electron microscope (SEM)
Tokyo, JapanNANOMETRICS VERTEX-SM-110
- Manufacturer: Nanometrics
- Model: VERTEX-SM-110
Manufacturing process: examination
Tokyo, Japan- Tokyo, Japan
2005 HITACHI S-9380II
- Manufacturer: Hitachi
- Model: S-9380 II
Manufacturing process: examination | Inch: 12
Tokyo, Japan2008 HITACHI CG-4000
- Manufacturer: Hitachi
- Model: CG4000
Manufacturing process: examination | Inch: 12
Tokyo, Japan- Tokyo, Japan
- Tokyo, Japan
- Tokyo, Japan