Building Filters
About the Jeol JSM
The Jeol JSM series are versatile scanning electron microscopes designed for high‑resolution imaging and materials analysis. Built for labs and industrial inspection, the JSM line offers flexible detector options, stable optics and user‑friendly operation for research, failure analysis and quality control.
- Trusted Seller
JEOL Jeol JSM-5910LV SEM Scanning Electron Microscope Lab
- Manufacturer: Jeol
- Model: JSM
This Jeol JSM-5910LV SEM Scanning Electron Microscope was removed from a university lab where it was surplus to requirements. The system has not been tested. The Oxford dewar has come away from the unit and dent...
United States