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| Type | Scanning Electron Microscope |
| Electron source | Tungsten, LaB6, Field emission |
| Accelerating voltage | 100-30000 V |
| Resolution (probe) | 0.5-5 nm |
This Jeol JSM-5910LV SEM Scanning Electron Microscope was removed from a university lab where it was surplus to requirements. The system has not been tested. The Oxford dewar has come away from the unit and dent...
You are Buying a Lot of 3 Valves from Jeol Scan Microscope JSM-6600F Used. Sold As Is. Lot of 3 Valves from Jeol Scan Microscope JSM-6600F Please Ask Any Question or Concern Before Bidding 2474 All items are sold...
- It was upgraded 5 years ago to Windows control, now running under Windows 10. - There is a thin water cooling line, protecting the lower part of the column while baking the gun at the top, which is almost clog...
Resolution: - 1nm guaranteed at 15kV SEM mode - 2.5nm at 1kV in SEM mode - 1.5nm at 1kV in GB mode Magnification: - SEM: x100 (at WD 25mm) to x1,000,000 (at WD 8mm) - Low-Mag LM mode: x25 to x19,000 Imagin...
“Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope System” JEOL JSM-6300F Ion Vacuum Pump Magnet Assembly Wafer Defect Review SEM Working Inventory # 21078 Removed from a JEOL JSM-6300F SEM Scanning ...