Used Test & Measurement (Semiconductors) in Texas, USA

2000 Hitachi Feeder Test Station

• used

• Manufacturer: Hitachi

Tests Feeders and Carts .

Universal GSM Feeder Test Station

• used

• Manufacturer: Universal Instruments

Model 45577706 .

Universal GSM Feeder Test Station

• used

• Manufacturer: Universal Instruments

Model: 45577702 120 VAC 1.5A 85 PSI .

2000 Hitachi Feeder Test Station

• used

• Manufacturer: Hitachi

Tests Feeders and Carts .

Kulicke & Soffa (K&S) 8098

• used

• Manufacturer: Kulicke & Soffa
• Model: 8098

K & S 8098 Bonder Wafer size: 200mm

Thermawave OP 2690

• used

• Manufacturer: Therma-Wave

TW OP 2600 converted to OP 2690 with a pentium 450 processor.

1995 Rudolph FE-IIID

• used

• Manufacturer: Rudolph

Rudolph FE-IIID Dual Wavelength Focus Ellipsometer Measurement Console The Measurement Console contains the following components: • Measurement system (including vacuum control, stage, lifters, optical components...

Rudolph Auto EL Elipsometer

• used

• Manufacturer: Rudolph
• Model: Auto EL

Rudolph Auto EL Elipsometer Wafer size: 150mm

Thermawave OP 2600

• used

• Manufacturer: Therma-Wave
• Model: OP 2600

ThermaWave OP 2600 optiprobe Wafer size: 200mm

Jeol 7555S

• used

• Manufacturer: Jeol
• Model: 7555S

JEOL 7555S Wafer Inspection System Wafer size: 200mm

Four Dimensions CV92-A CapEx Outsource, LLC Error

• used

• Manufacturer: Four Dimensions

Desktop Mercury Probe CV Mapper CV92A Embedded computer and a PC Up to 200 mm - 8 inch capability Drawer for receiving the wafer CVmap software Power: 100 / 115 / 230 VAC, 50/60Hz, 300 W Compressed air 60 psi min...

1992 Rudolph FE III

• used

• Manufacturer: Rudolph
• Model: FE-III

KLA Tencor SFS 4500 Surfscan

• used

• Manufacturer: KLA-Tencor
• Model: Surfscan 4500

KLA SFS 4500 Surfscan

KLA Tencor P2 Profiler

• used

• Manufacturer: KLA-Tencor

KLA P2 Profiler

1999 Jeol JWS-7515

• used

• Manufacturer: Jeol
• Model: JWS-7515

JEOL JWS-7515 Wafer Inspection System Wafer size: 200mm