Used Test & Measurement (Semiconductors)

LTX 974-0248-00 Device Interface Board

1 in stock The LTX 974-0248-00 Device Interface Board is a specialized piece of equipment designed for use in semiconductor testing and assembly. Manufactured by LTX, this interface board allows for efficient com...

LEO 1455 Scanning Electron Microscope (SEM)

• Manufacturer: LEO Electron Microscopy

LEO 1455 Scanning Electron Microscope Capable of handling a full 6in (150mm) wafer Tool unfortunately did not work well after receiving a software and PC upgrade. However, tool may work with some deeper investi...

Cascade Microtech Summit 12000 Prober 64525

• Manufacturer: Cascade Microtech
• Model: Summit

Cascade Microtech Summit 12000 200mm Prober with Attoguard Microchamber and -65°C to 200°C Shielded Chuck. Cascade Microtech 12000 8 inch Semiautomatic Analytical Probe Station with MicroChamber™ that isolates an...

Cascade Microtech S300 64518

• Manufacturer: Cascade Microtech

Cascade Microtech S300 semi-automatic and manual RF/Microwave Probing System for quick and reliable 300 mm on-wafer test and characterization. The S300 supports wafer sizes and shards from 0.5 in. (1 mm) all the ...

Cascade Microtech Summit 12000 64520

• Manufacturer: Cascade Microtech
• Model: Summit

Cascade Microtech Summit 12000 200mm Prober with Attoguard Microchamber and -65°C to 200°C Shielded Chuck. Cascade Microtech 12000 8 inch Semiautomatic Analytical Probe Station with MicroChamber™ that isolates ...

Dage 4000 series ISA/PC12-UPGRADE 64977

• Manufacturer: Nordson DAGE
• Model: 4000

Dage 4000 TPAXY Modular Wire Pull/Die Shear Bond Tester. Intuitive operating screens enable quick test set up and editing of parameters. Motorized stage allows for semiautomatic bond testing. Currently configured ...

Cascade Microtech ELITE 300 Precision Low Noise Automated Wafer Prober 65060

• Manufacturer: Cascade Microtech

Configured with a 300MM Femtoguard temperature chuck. The Elite™ 300 is essential for characterizing devices at the 32 nm technology node and beyond. This probe systems uses PureLine™ technology to achieve one of...

Dage 4000-BS5KG-R 64794

• Manufacturer: Nordson DAGE
• Model: 4000

Dage 4000-BS5KG-R Ball Shear 5KG Load Cell with Rotation. Tested Good.

Cascade Microtech ECX-56 Expansion Module 65100

• Manufacturer: Cascade Microtech

Cascade Microtech ECX-56 Expansion Module. Expansion box for Cascade Microtech and Alessi wafer probers.

Cascade Microtech Probe Card Holder 64522

• Manufacturer: Cascade Microtech

Cascade Microtech Probe Card Holder. Probe card holder for the Summit and the S300 Cascade wafer probers.

Karl Suss Dark Box 64455

• Manufacturer: SÜSS MicroTec

KARL SUSS Prober Dark Box Enclosure. Light tight enclosure for wafer probers. Cable ports on both sides of box. Easy lift front panel. Inside Dimensions: 38” L x 29” W x 40” H. Has several Scratches in panels. Do...

KLA-Tencor SP1 Test & Measurement (semiconductors)

• Manufacturer: KLA-Tencor
• Model: SP1

Good condition KLA-Tencor SP1 Test & Measurement (semiconductors)s manufactured in 2006. Located in South Korea and other countries. Click request price for more information.