Used sensor

BALLUFF BOS 26K-PA-1LHC-S4-C SENSOR

• Manufacturer: Balluff

NCS OPA-1000L Dual Light Source Fully Automatic Oversized Metal Component In-Situ Analyzer

• Manufacturer: Steel Nano

Instrument name: OPA -1000L Dual Light Source Fully Automatic Oversized Metal Component In-Situ Analyzer | Instrument model: OPA-1000L | Spectral range: 160 nm ~ 650 nm | Primary dispersion ratio: 0.74 nm/mm | S...

omron Laser sensor ZX-LDA41 ZX-LDA41

• Manufacturer: Omron

Article no.: ZX-LDA41 | Shipping: Express delivery possible | Guarantee in months: 12 | Traces of use: None till slight traces of use | Case: Very good slight scratches | Voltage: 12 - 24 V DC | Switching state ...

2009 SDI/SEMILAB WT-2000PV

• Manufacturer: Semilab
• Model: WT-2000PV

■ System Configuration . WT2000PV main unit with scanning capability . Sample stage (Max wafer size 200mm) . μ-PCD head for lifetime measurements . Vacuum pump . Utility : ■ Hadware Function Capability . μ-PCD me...

HORIBA, Ltd. Xtrology

• Manufacturer: Horiba

Fully Automated Thin Film Inspection System Combines multiple sensors and automation technology to provide increased value for semiconductor wafer inspection The new product, "Xtrology," Fully Automated Thin Film...

HORIBA, Ltd. PD10

• Manufacturer: Horiba

Reticle / Mask Particle Detection System Next-generation inspection platform to meet future needs PD10 is the latest generation of the HORIBA Particle Inspection product line. Based on an innovative modular platf...

1997 Three-dimensional Manual Tesa Microval (XYZ) 400 x 500 x 400 mm

• Manufacturer: Tesa

Tesa Manual Three-Dimensional Machine Microval 4.5.3 Model X-axis travel: 400 mm Y-axis travel: 500 mm Z-axis travel: 400 mm Retrofitted with Renishaw scale and sensor and Mitutoyo QM-data panel Year: 1997, but h...