New York, USA
SPEA H3560 Test System with Chiller
- Manufacturer: SPEA
- Model: H3560
SPEA H3560 test system Was used for testing of MEMS accelerometers Capable of handling LGA devices with tray input and tray output Equipped with SPEA THCU 160 thermal conditioning unit (-65C to +200C) Windows...
New York, USA
2010 SPEA H3560 Test System with Chiller
- Manufacturer: SPEA
- Model: H3560
SPEA H3560 test system Was used for testing of MEMS accelerometers Capable of handling LGA devices with tray input and tray output Equipped with ERS Electronic GmbH AC3 Chiller (-55C to +140C) Windows XP v200...
New York, USA
2010 SPEA H3560 Test System with Tape-and-Reel Output
- Manufacturer: SPEA
- Model: H3560
SPEA H3560 test system Was used for testing of MEMS accelerometers Capable of handling LGA devices with tray input and tray output Equipped with tape and real output (RSU200 taper) Windows XP v2002 P3 Handle...
New York, USA
2011 SPEA H3560 with Tape and Reel Output and Chiller
- Manufacturer: SPEA
- Model: H3560
SPEA H3560 test system Was used for testing of MEMS accelerometers Capable of handling LGA devices with tray input and tray output Equipped with tape and reel output (RSU200 taper) Equipped with ERS Electroni...
New York, USA
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