 - Ultrasonic scanning microscope Laes1200- 1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various... Shanghai, China
 - Ultrasonic Scanning Microscope Laes1000- 1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various... Shanghai, China
 - Ultrasonic scanning microscope Laes810- 1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various... Shanghai, China
 - Ultrasonic Scanning Microscope Laes600- 1. Introduction: 1. Ultrasonic scanning microscope detection technology has the characteristics of fast detection speed and no damage to workpieces. It is widely used in medical, petroleum, automobile, semiconduc... Shanghai, China
 - Ultrasonic scanning microscope Laes430- 1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various... Shanghai, China
 - Ultrasonic scanning microscope Laes420- 1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various... Shanghai, China
 - Ultrasonic scanning microscope Laes620- 1. Introduction: 1. As China's semiconductor materials industry begins to promote the "Nanniwan Spirit" of domestic manufacturing and self-reliance, it is developing in the direction of refinement, high-end, cutt... Shanghai, China
 - Ultrasonic scanning microscope Laes630- 1. Introduction: 1. As China's semiconductor materials industry begins to promote the "Nanniwan Spirit" of domestic manufacturing and self-reliance, it is developing in the direction of refinement, high-end, cutt... Shanghai, China
 - Ultrasonic Scanning Microscope T300- 1. Introduction: 1. Ultrasonic scanning microscope detection technology has the characteristics of fast detection speed and no damage to workpieces. It is widely used in medical, petroleum, automobile, semiconduc... Shanghai, China
 - Ultrasonic Scanning Microscope Laes1100- 1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various... Shanghai, China
 - Ultrasonic scanning microscope Laes830- 1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various... Shanghai, China
 - Ultrasonic Scanning Microscope Laes800- 1. Introduction: 1. Ultrasonic scanning microscope detection technology has the characteristics of fast detection speed and no damage to workpieces. It is widely used in medical, petroleum, automobile, semiconduc... Shanghai, China
 - Ultrasonic scanning microscope Laes510- 1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various... Shanghai, China
 - Ultrasonic scanning microscope Laes330- 1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various... Shanghai, China
 - Ultrasonic scanning microscope Laes320- 1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various... Shanghai, China

