Used table

ADE 6033 Wafer Tester

• Manufacturer: ADE

WAFER TESTER FOR WAFER THICKNESS INCLUDES LARGE ANVIL STYLE TABLE TO HOLD SMALL OR LARGE SUBSTRATES

Four Dimensions CV92-A CapEx Outsource, LLC Error

Desktop Mercury Probe CV Mapper CV92A Embedded computer and a PC Up to 200 mm - 8 inch capability Drawer for receiving the wafer CVmap software Power: 100 / 115 / 230 VAC, 50/60Hz, 300 W Compressed air 60 psi min...

Semiprobe Diced wafer Inspection system

• Manufacturer: Semiprobe

Semiprobe Diced wafer Inspection system with wafer mapping software Semiprobe wafer prober mounted on Newport table Inspects diced wafers mounted on film frames Wafer stage with motorized X,Y and theta Motic ...

Signatone CM-465-22

• Manufacturer: Signatone
• Model: CM-465-22

Status of Equipment: De-installed Process Type: Wafer Probes Signatone CM460-22 semiautomatic probe station which includes / SIGNATONE WL210 / Vibration Isolation Table /Monitor Mount, KEITHLEY 2636B SOURCE MET...

Signatone CM460-22

• Manufacturer: Signatone
• Model: CM-460-22

Signatone CM460-22 semiautomatic probe station 150mm wafer chuck probe card holder joystick controller XY linear motor drive for chuck manual XY microscope translation Mitutoyo FS60 microscope with fiber l...

TOKYO SEIMITSU RONDCOM31A-N E-1F-R12A SURFACE PROFILER T94381

• Manufacturer: Accretech - Tokyo Seimitsu - TSK
• Model: Rondcom 31

Control turns on. We don't know if this machine is complete or is missing some components. Table not tested. Fair condition. 120 VAC. Extra Information Brand: Tokyo Seimitsu MPN: RONDCOM31A-N, E-1F-R12A Shipping ...

Micromanipulator 2250 Large Area Panel Prober

• Manufacturer: Micromanipulator
• Model: 2250

Micromanipulator 2250 Large Area Panel Prober Large area flat panel prober with 36"x48" air isolation table, 14.5" x 14.5" stage with quick load feature (16" travel front to back), each 34"x4" platen has indepen...

Veeco / Digital Instruments Dimension 3100 Atomic Force Microscope (AFM)

• Manufacturer: Veeco - Sloan
• Model: Dimension 3100

- Comes with all necessary components Including: - Upgraded AFM Control Computer with NanoScope V 6.13 Control Software - NanoScope Analysis V 1.5 - Dual 22" Dell Flatscreen Monitors - Digital instruments Tr...

RUDOLPH FE-VII-D, Focus Ellipsometer

• Manufacturer: Rudolph

RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...

Cascade Microtech Summit 12000

• Manufacturer: Cascade Microtech
• Model: Summit

Cascade Microtech Summit 12000 200mm Prober with Attoguard Microchamber and -65°C to 200°C Shielded Chuck. Cascade Microtech 12000 8 inch Semiautomatic Analytical Probe Station with MicroChamber™ that isolates an...