- $3,450 USDSan Jose, CA
Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage
- Manufacturer: Veeco - Sloan
- Model: Dimension
Nanoscope III SPM and controller LSS large sample scanning stage allows imaging on samples up to 8"x8" with 6"x6" XY travel. Samples up to 1.25" thick Includes 850x optical microscope and fully automated stag...
Cascade Probe Card Holder 115-418 for Summit 11XXX and 12XXX series Probers with microchamber
- Manufacturer: Cascade Microtech
- Model: Summit
Cascade Microtechprobe 115-418 card holder for microchamber with clamp holder Back pivoting edge connector Maintains a dark and dry EMI-RFI shielded environment Stable 3 point planarization theta micrometer c...
$3,950 USDSan Jose, CAMalcom PCU-201 Spiral Viscometer
- Manufacturer: Malcom
Spiral viscometer for solder paste, thick film pastes, liquid resists, and inks printer viscosity range 50-10,000p temperature control of sample
$3,950 USDSan Jose, CAZeiss/HSEB Axiospect 300 Automated Wafer Inspection and Review station for 200mm/300mm wafers
- Manufacturer: HSEB
Wafer inspection/review station for bare and patterned wafers Inspect 300mm wafers in FOUP loaders or 200mm wafers in open cassetes with adaptors 2 FOUP loaders Axiotron 300 microscope Equipe robot with PRE-5...
Nikon Optiphot 300 with reflected and transmitted light and 10x14 XY stage travel
- Manufacturer: Nikon
- Model: Optiphot 300
Configured for Reflected and Transmitted Light Brightfield & Darkfield observation Trinocular Viewing Head 5 place nosepiece with motorized rotation and keypad CF Plan 5x/10x/20x/50x objectives stage with gl...
Nikon DIC motorized polarizer for Optiphot 200/300 with 1/4 wave plate
- Manufacturer: Nikon
- Model: Optiphot 200
Nikon DIC motorized polarizer for Optiphot 200/300 with 1/4 wave plate
$1,950 USDSan Jose, CANikon NWL860-TMB-SP wafer loader with Eclipse L200 microscope for 150/200mm wafers with macro and backside inspection
- Manufacturer: Nikon
- Model: NWL860
Nikon Eclipse L200 microscope with 5/10/20/50 LU Plan BD objectives for brightfield and darkfield Nikon NWL-860-TMB wafer loader with macro and backside inspection modes Nikon 8x8 shuttle stage Alignment plate...
Agilent 4156C Semiconductor Parameter Analyzer
- Manufacturer: Agilent - Keysight
- Model: 4156C
General features - Highly accurate laboratory bench top parameter analyzer for advanced device characterization - 4x High-resolution SMU, 2xVSU and 2xVMU - Fill-in-the blanks front panel operation - Measurement c...
Nikon NWL860T wafer loader for 150-200mm wafers
- Manufacturer: Nikon
- Model: NWL860
Nikon wafer loader for 150/200mm wafers Prealignment for wafer flat or notch Shuttle stage additional add $4500.
Nikon Optiphot 150 Inspection Microscope for brightfield, darkfield, and DIC
- Manufacturer: Nikon
- Model: Optiphot 150
Reflected light microscope configured for brightfield, darkfield, and DIC ( Nomarkski) inspection stage has 6x6 xy travel 5 place universal nosepiece CF BD Plan DIC 5x/10x/20x/50x objectives 4 Nomarski prisms...
Signatone CM460-22 semiautomatic probe station
- Manufacturer: Signatone
- Model: CM-460-22
150mm wafer chuck probe card holder joystick controller XY linear motor drive for chuck manual XY microscope translation Mitutoyo FS60 microscope with fiber light source pneumatic isolation table available ...
Semiprobe Diced wafer Inspection system with wafer mapping software
Semiprobe wafer prober mounted on Newport table Inspects diced wafers mounted on film frames Wafer stage with motorized X,Y and theta Motic PSM-1000 microscope with 5x and 20x objectives video port with camer...
Logitech PP6 lapping jig with 100mm vacuum chuck
- Manufacturer: Logitech
- Model: PP6
100mm (4") vacuum chuck vacuum tube dial indicator gauge Rotary vacuum connector in photo is not included
Zeiss LM100 Inspection Microscope for wafers up to 450mm or flat panels up to 548mmx548mm with motorized stage, brightfield, darkfield, and Nomarski inspection
- Manufacturer: Zeiss
- Model: LM100
Zeiss inspection microscope for large wafers and panels with reflected and transmitted light Brightfield, darkfield, Nomarski (DIC) inspection Merzhauser motorized xy stage with 550mm x 550mm travel (21.6"x21.6...