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Nanometrics Nanospec AFT2100 Film Thickness Measurement System
- Manufacturer: Nanometrics
- Model: Nanospec AFT 2100
film thickness from 100A to 50 microns Upgraded to new Olympus MS Plan infinity corrected 5x/10x/50x objectives including new vertical illuminator spot size 6.5um to 65um wavelength range 400-800nm 16 standar...
United States Rudolph Research Auto EL III Ellipsometer
- Manufacturer: Rudolph
- Model: Auto EL-III
The Rudolph Ellipsometer AutoELIII allows measurement of the thickness and refractive index of one or two thin transparent films on a substrate. Features: Internal data reduction software for single and double la...
San Jose, CANanometrics Nanospec AFT2100 Film Thickness Measurement System
- Manufacturer: Nanometrics
- Model: Nanospec AFT 2100
UPGRADE AVAILABLE TO FLAT PANEL MONITOR ADD $3500. film thickness from 100A to 50 microns Upgraded to new Olympus MS Plan infinity corrected 5x/10x/50x objectives including new vertical illuminator spot size 6...
$14,500 USDSan Jose, CARudolph Research FE-III Focus Ellipsometer
- Manufacturer: Rudolph
- Model: FE-III
The FE-III has fully automatic operation and a scanning stage. Unique optical and detection systems measure ellipsometric parameters over an angle range of 40 to 70 degrees simultaneously, giving more flexibility...
San Jose, CARudolph FE-VII-SD
- Manufacturer: Rudolph
For sale is a high-precision Rudolph FE-VII-SD Ellipsometer, known for its advanced capabilities in thin film measurement and analysis. This tool is ideal for semiconductor manufacturing, materials research, and ...
$4,950 USDHayward, CA