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Used operator interface

Trusted Seller
SPI 331843-B Operator Interface Used
- Manufacturer: SPI
Removed from: Van Dorn Injection Molding Machine Model: 880SP4300 Serial: 0167 Expedited shipping services are available upon request. All taxes due are the responsibility of purchaser. Visitors are welcome ...
$495 USD
Holly, MI
Aqueous Technologies SMT800-LD
- Manufacturer: Aqueous
- Model: SMT800-LD
Automatic Wash + Rinse + Cleanliness Test + Dry + SPC Lead Free Ready The SMT Series Cleaning Systems include the industry's most powerful batch-format drying system. The SMT series cleaners utilize a combination...
Farmingdale, NJ
Tektronix 576 Curve Tracer with Computer Interface CALIBRATED WARRANTY SOFTWARE
- Manufacturer: Tektronix
- Model: 576
“FULLY REFURBISHED & CALIBRATED. 1 YEAR WARRANTY FOR LOCAL CUSTOMERS. SEE PICS FOR FEATURES” Comes with software for Windows XP/7/8/10 and Linux (under Wine) REFURBISHED *** CALIBRATED ** WARRANTIED ( 1 YEAR WARR...
$4,996 USD
Menlo Park, CA
Trusted Seller
KLA-Tencor SP1 TBI Unpatterned Surface Inspection System
- Manufacturer: KLA-Tencor
- Model: SP1
KLA-TENCOR SP1 TBI UNPATTERNED SURFACE INSPECTION SYSTEM consisting of: - Model: SP1 TBI- Up to 300mm Wafers- Inquire about Handler Options for Various Size Wafers- Unpatterned Surface Inspection System - Wafer M...
Decatur, GA
Trusted Seller
MEK Marantz PowerSpector M22XGTAz-520
- Manufacturer: Marantz
Details: Direct Loading Orca Chassis (9) Total Cameras: 1 – 4Mp, 24bit CAM with 18.75u High Grade TC Lens Top Down / 8 – USB3 Vision Multiplex Side Cameras with 10u TS Lens 30mm Z-Axis Clearance +30/-60mm Integra...
Nashua, NH
Trusted Seller
KLA-Tencor AIT II Patterned Surface Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT II
KLA-TENCOR AIT II (200mm/300mm) PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT II- Wafer Size: 200mm- 150/200mm Open Handler - Software Version 5.3.17.4- Double Darkfield Inspection Tool -...
Decatur, GA
Trusted Seller
KLA-Tencor AIT I Patterned Surface Defect Inspection System consisting
- Manufacturer: KLA-Tencor
- Model: AIT I
KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...
Decatur, GA
Trusted Seller
KLA-Tencor AIT I Patterned Surface Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT I
KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...
Decatur, GA
BEIJER CIMREX 69 - TYPE 03650A TOUCH SCREEN DISPLAY ($425 OBO)
- Manufacturer: BEIJER
“GREAT CONDITION” BEIJER CIMREX 69 TOUCHSCREEN OPERATOR INTERFACE COLOR LCD TYPE 03650A NO: 0136-008 24VDC 450mA ***Local deliveries available, simply message us before purchasing so we can properly adjust the li...
$425 USD
Waukesha, WI
Trusted Seller
2004 KLA- Tencor Surfscan SP 1 DLS Unpatterened Surface Inspection
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
- Refurbished - 0.050 um Defect Sensitivity on Polished Bare Silicon - Enhanced Rough Film Sensitivity - Already upgraded with ENH SS laser - Defect Map and Histogram with Zoom - RTDC (Real Time Defect Class...
United States
Trusted Seller
2006 KLA eS32 e-beam wafer inspection 200mm
- Manufacturer: KLA-Tencor
KLA eS32 E-beam Wafer Inspection 200mm eS32 is a top-of-the-line mask and wafer inspection equipment that is designed to meet the most stringent quality standards for semiconductor product manufacturing. This sy...
United States
Trusted Seller
1997 KLA AIT I Main System
- Manufacturer: KLA-Tencor
- Model: AIT I
Currently Configured for 6"/150mm & 8"/200mm Wafers Double Darkfield Inspection Tool SECS II/GEM Communication Interface Low Contact Chuck (AIT I) Multi Channel Collection Optics System with Independent Progr...
United States
Rudolph Research Auto EL IV Ellipsometer
- Manufacturer: Rudolph
- Model: Auto EL-IV
The AutoEl IV has automatic 3 wavelength operation and a scanning stage. Multiple wavelength operation gives this instrument more flexibility for meauring multiple film stacks. The scanning stage allows wafer uni...
San Jose, CA
KLA-Tencor SP1-TBI Unpatterned Surface Inspection System
- Manufacturer: KLA-Tencor
- Model: SP1
KLA-Tencor's SP1 configured with KLA-Tencor's Trible-Beam Illumination (TBI). Specifications: Dual Dark Field Collection Channels. Sensitivity 60nm / 0.060µm. 0.001 ppm Haze Sensitivity. Argon Ion Laser (488nm. I...
San Jose, CA
KLA Tencor Surfscan SP1-DLS Wafer Surface Analysis System
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
KLA Tencor Surfscan SP1-DLS Wafer Surface Analysis System set up for 200mm Edge Grip Handler. Cassette Open Handler System/SMIF/Dual Cassette. System refurbished to meet OEM Specifications. Features: Includes the...
San Jose, CA