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SPI 331843-B Operator Interface Used
- Manufacturer: SPI
Removed from: Van Dorn Injection Molding Machine Model: 880SP4300 Serial: 0167 Expedited shipping services are available upon request. All taxes due are the responsibility of purchaser. Visitors are welcome ...
$495 USDHolly, MI 
Aqueous Technologies SMT800-LD
- Manufacturer: Aqueous
- Model: SMT800-LD
Automatic Wash + Rinse + Cleanliness Test + Dry + SPC Lead Free Ready The SMT Series Cleaning Systems include the industry's most powerful batch-format drying system. The SMT series cleaners utilize a combination...
Farmingdale, NJTektronix 576 Curve Tracer with Computer Interface CALIBRATED WARRANTY SOFTWARE
- Manufacturer: Tektronix
- Model: 576
“FULLY REFURBISHED & CALIBRATED. 1 YEAR WARRANTY FOR LOCAL CUSTOMERS. SEE PICS FOR FEATURES” PLEASE VIEW THE PICTURES TO UNDERSTAND WHAT THIS TEK 576 CAN DO FOR YOU. Youtube videos: Comes with software for Window...
$4,996 USDMenlo Park, CA- Trusted Seller

KLA-Tencor SP1 TBI Unpatterned Surface Inspection System
- Manufacturer: KLA-Tencor
- Model: SP1
KLA-TENCOR SP1 TBI UNPATTERNED SURFACE INSPECTION SYSTEM consisting of: - Model: SP1 TBI- Up to 300mm Wafers- Inquire about Handler Options for Various Size Wafers- Unpatterned Surface Inspection System - Wafer M...
Decatur, GA - Trusted Seller

KLA-Tencor AIT I Patterned Surface Defect Inspection System consisting
- Manufacturer: KLA-Tencor
- Model: AIT I
KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...
Decatur, GA - Trusted Seller

KLA-Tencor AIT I Patterned Surface Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT I
KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...
Decatur, GA - Trusted Seller

KLA-Tencor AIT II Patterned Surface Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT II
KLA-TENCOR AIT II (200mm/300mm) PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT II- Wafer Size: 200mm- 150/200mm Open Handler - Software Version 5.3.17.4- Double Darkfield Inspection Tool -...
Decatur, GA - Trusted Seller
KLA-Tencor Surfscan SP1 DLS Unpatterned Surface Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
KLA-TENCOR SURFSCAN SP1 DLS UNPATTERNED SURFACE INSPECTIONSYSTEM consisting of:- Model: SP1 DLS with 300mm Single FOUP/FIMS Handler (other handlers available)- Currently Configured for 200/300mm Wafers - Unpatter...
Decatur, GA - Trusted Seller

2004 KLA- Tencor Surfscan SP 1 DLS Unpatterened Surface Inspection
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
- Refurbished - 0.050 um Defect Sensitivity on Polished Bare Silicon - Enhanced Rough Film Sensitivity - Already upgraded with ENH SS laser - Defect Map and Histogram with Zoom - RTDC (Real Time Defect Class...
United States - Trusted Seller

2006 KLA eS32 e-beam wafer inspection 200mm
- Manufacturer: KLA-Tencor
KLA eS32 E-beam Wafer Inspection 200mm eS32 is a top-of-the-line mask and wafer inspection equipment that is designed to meet the most stringent quality standards for semiconductor product manufacturing. This sy...
United States - Trusted Seller

1997 KLA AIT I Main System
- Manufacturer: KLA-Tencor
- Model: AIT I
Currently Configured for 6"/150mm & 8"/200mm Wafers Double Darkfield Inspection Tool SECS II/GEM Communication Interface Low Contact Chuck (AIT I) Multi Channel Collection Optics System with Independent Progr...
United States 
KLA-TENCOR SURFSCAN 6220 (SFS 6220)
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-Tencor Surfscan 6220 (SFS 6220) Wafer Surface Contamination Analysis System The SFS 6220 tool is used for wafer surface contamination analysis of unpatterned semiconductor wafers. System is calibrated, tes...
$171,540 USDSan Jose, CA
KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM W/ 4200 SMU
- Manufacturer: Keithley
- Model: 4200
Information: 1) KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM 3) 4200 SMU CARDS The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time...
Santa Barbara, CA- Trusted Seller

Seamark X1000 X-Ray SMD Counter
X1000 X-ray SMD Counter: 7-15 inch reels, Loose or tightly wound components scanning Support Automatic counting components on reels, belts, ESD bags and in JEDEC trays Automated counting of unknown components Fas...
Veenendaal, Netherlands - Trusted Seller

Reticle Inspection
- Manufacturer: Unknown
Tool Condition: tool is power off and installed in the cleanroom. STANDARD SPECIFICATIONS DESCRIPTION Main PC- Included x1 Keyboard & Mouse- Included x1 UPS- Included x1 Fully automated particle measurement modul...
Bree, Ireland
