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2006 KLA eS32 e-beam wafer inspection 200mm
- Manufacturer: KLA-Tencor
KLA eS32 E-beam Wafer Inspection 200mm eS32 is a top-of-the-line mask and wafer inspection equipment that is designed to meet the most stringent quality standards for semiconductor product manufacturing. This sy...
United States 
Mirtec MV-7xi AOI System (11/2014)
- Manufacturer: Mirtec
- Model: MV-7XI
Mirtec MV-7xi AOI System DOM: 11/2014 Inline System 3 Stage Conveyor Max board: 20" x 18" 5 Camera System 10 Mega Pixel Digital Color Camera Precision Telecentric Compound Lens Design 9.8 Micron / Pixel Resolu...
St. Petersburg, FL
Mirtec MV-7U AOI System (2009)
- Manufacturer: Mirtec
- Model: MV-7U
Mirtec MV-7U AOI System Large Board AOI Five Camera In-Line AOI System 10 MP cameras with ISIS Vision 13.4 micron um/pixel TELECENTRIC COMPOUND lenses. Board Size: min 2.0"x2.0" max 26.0" x 24.1" Integrated INTEL...
St. Petersburg, FL
2007 Yestech YTX-X1
- Manufacturer: Yestech
Yestech YTX-X1 X-Ray System Automated In-line X-Ray Inspection System Vintage: 2007 Maintenance free Tube Sealed reflection target 130 Kv 5 micron spot size 39-watt max. output CAD Input: Pick and place data, CAD...
St. Petersburg, FL
Yestech YTX-X1 X-ray System
- Manufacturer: Yestech
Yestech YTX-X1 X-Ray System Automated In-line X-Ray Inspection System Maintenance free Tube Sealed reflection target 130 Kv 5 micron spot size 39-watt max. output CAD Input: Pick and place data, CAD x-y data CAD...
St. Petersburg, FL
Fully Automatic Mass Production Wafer Prober
Product Introduction MDSM-FA8 is a new high-power prober with a temperature range from room temperature to +200 °C and supports the measurement of high voltage 3 kV (Tri-axis)/10 kV (coaxi-al) and 500A. It can te...
Guangzhou, China
