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Tokyo Kokukeiki kk Receiver Wafer Mapping Unit Module MU-26b Working Surplus
- Manufacturer: Tokyo Kokukeiki kk
Tokyo Kokukeiki kk Receiver Wafer Mapping Unit Module MU-26b Working Surplus Model No: Receiver Wafer Mapping Unit 1468-101561 Tokyo Kokukeiki kk Wafer Mapping Unit Part No: MU-26b This Tokyo Kokukeiki kk Receive...
$1,502 USDAlbuquerque, NM 
Semiprobe Diced wafer Inspection system with wafer mapping software
Semiprobe wafer prober mounted on Newport table Inspects diced wafers mounted on film frames Wafer stage with motorized X,Y and theta Motic PSM-1000 microscope with 5x and 20x objectives video port with camer...
- Trusted Seller

CDE ResMap 273 Resistivity Mapping System
- Manufacturer: CDE
- Model: Resmap
CDE ResMap 273 Resistivity Mapping System consisting of:- Manufacturer: Creative Design Engineering - Model: ResMap 273 - PC w/ windows XP- Maximum Throughput: 1 minute per wafer- Measurement Range: 2 mΩ/- 5 MΩ/...
Decatur, GA - Trusted Seller
United States - Trusted Seller

KLA Tencor Surfscan 6200 Particle Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
KLA-TENCOR SURFSCAN 6200 PARTICLE INSPECTION SYSTEM consisting of:- Model: 6200 Surfscan- Particle Inspection System- Max Wafer Capable: 8”/200mm- System configured for 8“/200mm wafers- Defect Sensitivity: 0.12um...
Decatur, GA - Trusted Seller
KLA-Tencor Surfscan SP1 DLS Unpatterned Surface Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
KLA-TENCOR SURFSCAN SP1 DLS UNPATTERNED SURFACE INSPECTIONSYSTEM consisting of:- Model: SP1 DLS with 300mm Single FOUP/FIMS Handler (other handlers available)- Currently Configured for 200/300mm Wafers - Unpatter...
Decatur, GA - Trusted Seller

PROMETRIX SM200E
- Manufacturer: Prometrix
FOR MEASURING DIELECTRIC THIN FILMS ON WAFERS UP TO 8″ DIAMETER INCLUDES COMPUTER WITH MAPPING
Billerica, MA - Trusted Seller

KLA-Tencor Surfscan 5500 Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 5500
KLA-Tencor Surfscan 5500 Inspection System consisting of:- Model 5500 Main System- Can handle from 2" up to 8"/200mm wafers- Submicron sensitivity, detects 0.2 micron particles- Surface haze detected as low as 0....
Decatur, GA - Trusted Seller

NEW Takano WM-7SR Surface Particle Inspection System
- Manufacturer: Takano
- Model: WM-7
TAKANO WM-7SR SURFACE PARTICLE INSPECTION SYSTEM consisting of:- Model: WM-7SR- Bare wafer surface defect inspection system- Substrate/Sizes: 2" - 8" Wafer Capable (Chuck and Carrier type dependent)- Substrate Th...
Decatur, GA - Trusted Seller

2004 KLA- Tencor Surfscan SP 1 DLS Unpatterened Surface Inspection
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
- Refurbished - 0.050 um Defect Sensitivity on Polished Bare Silicon - Enhanced Rough Film Sensitivity - Already upgraded with ENH SS laser - Defect Map and Histogram with Zoom - RTDC (Real Time Defect Class...
United States - Trusted Seller

Semiprobe Diced wafer Inspection system
- Manufacturer: Semiprobe
Semiprobe Diced wafer Inspection system with wafer mapping software Semiprobe wafer prober mounted on Newport table Inspects diced wafers mounted on film frames Wafer stage with motorized X,Y and theta Motic ...
United States - Trusted Seller

Zeiss/HSEB Axiospect 300 Automated Wafer Inspection and Review station for 200mm/300mm wafers
- Manufacturer: HSEB
Wafer inspection/review station for bare and patterned wafers Inspect 300mm wafers in FOUP loaders or 200mm wafers in open cassetes with adaptors 2 FOUP loaders Axiotron 300 microscope Equipe robot with PRE-5...
United States - Trusted Seller

KLA-TENCOR Surfscan 5500
- Manufacturer: KLA-Tencor
- Model: Surfscan 5500
- Model 5500 Main System - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, detects 0.2 micron particles - Surface haze detected as low as 0.3 ppm. - Handles high scattering surfaces such as ...
United States - Trusted Seller

Takano WM-10R Surface Particle Inspection System
- Manufacturer: Takano
- Model: WM-10
TAKANO WM-10R SURFACE PARTICLE INSPECTION SYSTEM consisting of:- Model: WM-10R- Bare wafer surface defect inspection system- Substrate/Sizes: 2" - 12" Wafer Capable (Chuck and Carrier type dependent)- Substrate T...
Decatur, GA 
KLA-TENCOR SURFSCAN 6220 (SFS 6220)
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-Tencor Surfscan 6220 (SFS 6220) Wafer Surface Contamination Analysis System The SFS 6220 tool is used for wafer surface contamination analysis of unpatterned semiconductor wafers. System is calibrated, tes...
