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- Trusted Seller
National Instruments 186623E-02
- Manufacturer: National Instruments
186623E-02 | SCC-AI02, ±20 V Input, ±10 V Output, 10 kHz, Isolated Analog Input Module
Cary, NC 
Chroma 11802
- Manufacturer: Chroma
KEY FEATURES ■ HF HV Load Life Test (CV and CC mode) ■ HF Withstand Voltage Test (CV and CC mode) ■ HF Breakdown Voltage Test (CV mode) ■ Wide output voltage and current range while combine with different module ...
Farmingdale, NJ- Trusted Seller
High Power Source Monitor Unit Agilent B1510A
- Manufacturer: Agilent - Keysight
- Model: B1510A
Source/Measure Units (SMUs), such as the Keysight B1510A (Agilent), are the key measurement modules of the Agilent / Keysight B1500A Semiconductor Device Parameter Analyzer. The SMUs integrate voltage/current sou...
Shenzhen, China Module-Level Burn-in
Input/ output options: JEDEC Tray | Selection of packages: Silicon Carbide (SiC), Gallium Nitride (GaN) Power devices | Channel number: Up to 720 power device burn-in test parallelism | Burn-in duration: Program...
Penang, MalaysiaModule-Level Final Test
Input/ output options: Metal Tray, Blister Tray, Plastic Tube Stacker | Selection of packages: Plastic Case Power Modules, Double-side cooling power module (DSC) | Ambient/hot temperature test: Ambient Temperatu...
Penang, MalaysiaFinal Inspection
Power Module Final Inspection HandlerIt offers advanced final inspection solutions for 2D Pin position, 3D pin height inspection and cosmetic inspection for power modules before packing them into trays or plastic...
Penang, MalaysiaPin Insertion
Pin Insertion HandlerIt is capable of processing any manufacturers reeled thru-hole or press-fit products with real time insertion force monitoring and caters to multiple types of pins depending on requirements.
Penang, MalaysiaDBC/AMB Substrate-Level Test
Input/ output option: Slot Magazine | Package type: DBC Substrate, AMB Substrate | Ambient/hot temperature test: Ranging from 25°C to 175°C | Temperature control & features: (25°C to 175°C) | Soak time: >90s bas...
Penang, MalaysiaDie-Level Test
Input options: Waffle Pack, Wafer Ring, De-Taper | Output options: Waffle Tray, Wafer Reconstruction, Tape & Reel | Package type: Die | Test capabilities: AC Test, DC Test, UIS Test at ambient to hot temperature
Penang, Malaysia- Trusted Seller
X7600 Offline X-Ray Inspection Machine
X7600 inspection machine adopts the world's top Japanese Hamamatsu X-ray source. This industrial X-Ray machine can easily distinguish the semiconductor package gold wire bending, gold wire break, super large plat...
Shenzhen, China 
Wafer-Level Inspection
SiC & GaN Wafer-Level AOI HandlerTrooper-V is Pentamaster’s next level high speed AOI handler designed for wafer-level packages. With quality objective lens, it allows for different levels of magnification to acc...
Penang, MalaysiaWafer-Level Burn-in
Chuck quantity: Octa Chuck | Package type: Silicon Carbide (SiC) Power Device | Wafer size: 6, 8 inch | Input/ output option: Wafer Cassette (Up to 2 cassettes) | Die per wafer burn-in parallelism: 4000 | Total ...
Penang, MalaysiaDiscrete-Level Test
Input options: Vibrator Bowl, Plastic Tube Stacker | Output options: Tape & Reel, Plastic Tube Stacker | Test capabilities: Electrical Functional Test, Open Short Test, Insulation test | Test site: Dual Test Sit...
Penang, Malaysia
