Semiconductors » Test & Measurement (semiconductors)

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  • Trusted Seller
    KLA-Tencor AIT II Patterned Surface

    KLA-Tencor AIT II Patterned Surface Defect Inspection System

    • Manufacturer: KLA-Tencor
    • Model: AIT II

    KLA-TENCOR AIT II (200mm/300mm) PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT II- Wafer Size: 200mm- 150/200mm Open Handler - Software Version 5.3.17.4- Double Darkfield Inspection Tool -...

    Decatur, GA
  • Trusted Seller
    KLA-Tencor AIT I Patterned Surface

    KLA-Tencor AIT I Patterned Surface Defect Inspection System consisting

    • Manufacturer: KLA-Tencor
    • Model: AIT I

    KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...

    Decatur, GA
  • Trusted Seller
    KLA-Tencor AIT I Patterned Surface

    KLA-Tencor AIT I Patterned Surface Defect Inspection System

    • Manufacturer: KLA-Tencor
    • Model: AIT I

    KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...

    Decatur, GA
  • Trusted Seller
    2003 TEL P12XL

    2003 TEL P12XL

    • Manufacturer: Tokyo Electron - TEL
    • Model: P-12XL

    TEL, P12XL, 300mm Tool Status Connected Wafer Size 300 mm Fab Section Test Asset Description TEL P12XL Prober Software Version Standard CIM SECS GEM Process TEST Main System LA08 Prober 1 Factory Interfa...

    United States
  • Trusted Seller
    1997 KLA AIT I Main

    1997 KLA AIT I Main System

    • Manufacturer: KLA-Tencor
    • Model: AIT I

    Currently Configured for 6"/150mm & 8"/200mm Wafers Double Darkfield Inspection Tool SECS II/GEM Communication Interface Low Contact Chuck (AIT I) Multi Channel Collection Optics System with Independent Progr...

    United States
  • Trusted Seller
    KLA-Tencor Corp. Surfscan SP2.5+

    KLA-Tencor Corp. Surfscan SP2.5+

    • Manufacturer: KLA-Tencor
    • Model: Surfscan SP2

    Particle Measurement Metrology Equipment Currently Configured for: 300mm · Defect Inspection · Two Load Ports · SECS/GEM Capability · Integration to Klarity/UDB · Auto DSA · High resolution 3D imaging of ...

    United States
  • Trusted Seller
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    Hao Mian Technology Automated Optical Inspection AOI Taping System SECS GEM

    • Manufacturer: Unknown

    Hao Mian Technology Automated Optical Inspection (AOI) + Taping System (SECS / GEM) Automated Optical Inspection (AOI) + Taping System (SECS / GEM)

    Bree, Ireland
  • Trusted Seller
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    Hao Mian Technology Automated Optical Inspection AOI Taping System SECS GEM

    • Manufacturer: Unknown

    Hao Mian Technology Automated Optical Inspection (AOI) + Taping System (SECS / GEM) Automated Optical Inspection (AOI) + Taping System (SECS / GEM)

    Bree, Ireland
  • Trusted Seller
    no-image_en.png

    Hao Mian Technology Automated Optical Inspection AOI Taping System SECS GEM

    • Manufacturer: Unknown

    Hao Mian Technology Automated Optical Inspection (AOI) + Taping System (SECS / GEM) Automated Optical Inspection (AOI) + Taping System (SECS / GEM)

    Bree, Ireland
  • Trusted Seller
    Hitachi REM S806

    Hitachi REM S806

    • Manufacturer: REM
    • Model: S-806

    Hitachi Scanning Electron Microscope S806. With large specimen chamber. With Thermo/Noran EDX system Six. Detector nitrogen-cooled. Company: Hitachi Model: REM S806 Comment: German documents. Hitachi REM S806 Sco...

    Burladingen, Germany
  • Trusted Seller
    1985 KLA SURFSCAN 6220

    1985 KLA SURFSCAN 6220

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6220

    Wafer Size 200 mm Fab Section Metrology Tool Status Running Wafers Asset Description PCT0009(SMP-CTECH) Software Version WIN95 CIM GEM Process DO MEASUREMENT Options System NA OK Others LPT 1 OK Main Sys...

    Asia

Overview

Semiconductor inspection and test equipment are specialized machines used to ensure the quality and functionality of semiconductor devices. These machines perform various tests and inspections, including visual inspection, electrical testing, and defect analysis, to identify and address any issues in the semiconductor manufacturing process. They are crucial in maintaining the high standards required in the semiconductor industry.

FAQ

What factors should I consider when buying semiconductor inspection and test equipment?

Consider the equipment's compatibility with your existing systems, the types of tests it performs, its accuracy, and the manufacturer's support and service options. Also, evaluate its overall condition and any included software or accessories.

How can I ensure safe shipping of semiconductor inspection and test equipment?

Use a specialized transport service experienced in handling delicate and high-value equipment. Ensure the equipment is properly packaged, secured, and insured during transit.

What maintenance is required for semiconductor inspection and test equipment?

Regular maintenance includes cleaning, calibration, and software updates. Follow the manufacturer’s guidelines for specific maintenance intervals and procedures to ensure optimal performance and longevity of the equipment.