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- Trusted Seller
Four Dimensions CV92-A CapEx Outsource, LLC Error
Desktop Mercury Probe CV Mapper CV92A Embedded computer and a PC Up to 200 mm - 8 inch capability Drawer for receiving the wafer CVmap software Power: 100 / 115 / 230 VAC, 50/60Hz, 300 W Compressed air 60 psi min...
Grapevine, TX 
Tektronix 4200A-SCS-PK3^
- Manufacturer: Tektronix
- Model: 4200
In the 4200A-SCS-PK3 bundle, you should have received the 4200A-SCS Parameter Analyzer with: 4200-SMU medium-power (two) 4210-SMU high-power (two) 4210-CVU unit Keyboard with integrated mouse Clarius+ software US...
- Trusted Seller
AGILENT 4145B
- Manufacturer: Agilent - Keysight
- Model: 4145B
The HP 4145B Semiconductor Parameter Analyzer has four built-in source monitor units (SMUs). Each SMU can be independently programmed to function as either a voltage source/ current monitor or a current source/ v...
Cary, NC 
Biddle/AVO 27000
- Manufacturer: Biddle/AVO
Partial Discharge Detection System / Corona Analyzer The Biddle Series 27000 Partial Discharge (Corona) Detector is composed of four functional units: the amplifier, display, calibrator and evaluation unit.
Agilent/Keysight E5281A
- Manufacturer: Agilent - Keysight
- Model: E5281A
The N5281A is a four channel frequency converter test set. This test set is used with the N5242A 2-Port or 4-Port PNA-X Network Analyzer, and the N5264A Measurement Receiver.
$995 USDFarmingdale, NJ- Trusted Seller
Keysight 4145A
- Manufacturer: Agilent - Keysight
- Model: 4145A
Semiconductor Parameter Analyzer The 4145A Semiconductor Parameter Analyzer has four programmable stimulus/measurement units capable of high resolution plus wide range sourcing and sensing (1 pA to 100 mA; 1 mV t...
Cary, NC - Trusted Seller
Agilent 4145A
- Manufacturer: Agilent - Keysight
- Model: 4145A
Semiconductor Parameter Analyzer The 4145A Semiconductor Parameter Analyzer has four programmable stimulus/measurement units capable of high resolution plus wide range sourcing and sensing (1 pA to 100 mA; 1 mV t...
Cary, NC - Trusted Seller
Keysight (Agilent) 4145A
- Manufacturer: Agilent - Keysight
- Model: 4145A
Semiconductor Parameter Analyzer The 4145A Semiconductor Parameter Analyzer performs high speed DC characterization of semiconductor devices and materials automatically, saving you time and money. It has four pro...
Cary, NC 
Tektronix 4200A-SCS-PK2^
- Manufacturer: Tektronix
- Model: 4200
In the 4200A-SCS-PK2 bundle, you should have received the 4200A-SCS parameter analyzer with: 4200-SMU medium-power (two) 4210-CVU Keyboard with integrated mouse Clarius+ software USB flash drive Power line cord A...
Tektronix 4210-SMU/PA-R^
- Manufacturer: Tektronix
- Model: 4210-SMU
The Keithley High Power Source-Measure Unit for 4200-SCS. 1A to 100fA, 200V to 1µV, 20 Watt. Voltage error when using the ground unit is included in the Keithley 4210-SMU. The Keithley is four-quadrant source/sin...
Tektronix 4201-SMU
- Manufacturer: Tektronix
- Model: 4201-SMU
The Keithley 4201-SMU is a high-precision Source-Measure-Unit (SMU) within the 4200A-SCS Parameter Analyzer. It combines voltage and current source with ammeter and voltmeter for accurate DC-I-V measurements. Wit...
Farmingdale, NJ
MPI LEDA-8F 3G Plus-V 110 58957
- Manufacturer: MPI
MPI LEDA-8F 3G Plus-V 110 3G Wafer Prober. Plus-V is a wafer prober for testing diced die on stretch frame (dies on blue tape mounted on a tape ring). Wafers cut, broken by scribing, laser etc. and then expanded ...
- Trusted Seller
Yestech YTV-F1
- Manufacturer: Yestech
Top Down Viewing Camera 120VAC 1500W Max YESTech’s advanced Thin Camera technology offers high-speed PCB inspection with exceptional defect coverage. With up to two top-down viewing cameras and four side...
Magnolia, TX - Trusted Seller
Yestech YTV-F1
- Manufacturer: Yestech
Top Down Viewing Camera 120VAC 1500W Max YESTech’s advanced Thin Camera technology offers high-speed PCB inspection with exceptional defect coverage. With up to two top-down viewing cameras and four side...
Magnolia, TX - Trusted Seller
RUDOLPH FE-VII-D, Focus Ellipsometer
- Manufacturer: Rudolph
RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...
United States
