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  • Trusted Seller
    KLA Tencor Surfscan 6200 Particle

    KLA Tencor Surfscan 6200 Particle Inspection System

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6200

    KLA-TENCOR SURFSCAN 6200 PARTICLE INSPECTION SYSTEM consisting of:- Model: 6200 Surfscan- Particle Inspection System- Max Wafer Capable: 8”/200mm- System configured for 8“/200mm wafers- Defect Sensitivity: 0.12um...

    Decatur, GA
  • Trusted Seller
    KLA-Tencor AIT I Patterned Surface

    KLA-Tencor AIT I Patterned Surface Defect Inspection System

    • Manufacturer: KLA-Tencor
    • Model: AIT I

    KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...

    Decatur, GA
  • Trusted Seller
    Takano Altax 300ex Micro Bump

    Takano Altax 300ex Micro Bump Whole Surface Inspection System

    • Manufacturer: Takano

    Takano Altax 300ex Micro Bump Whole Surface Inspection System consisting of:- Model: Altax 300ex- Micro Bump Whole Surface Inspection System- Substrate/Sizes: 12" Wafer Capable - 40WPH/12 inch high-speed full lot...

    Decatur, GA
  • Trusted Seller
    KLA-Tencor AIT II Patterned Surface

    KLA-Tencor AIT II Patterned Surface Defect Inspection System

    • Manufacturer: KLA-Tencor
    • Model: AIT II

    KLA-TENCOR AIT II (200mm/300mm) PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT II- Wafer Size: 200mm- 150/200mm Open Handler - Software Version 5.3.17.4- Double Darkfield Inspection Tool -...

    Decatur, GA
  • Trusted Seller
    KLA-Tencor AIT I Patterned Surface

    KLA-Tencor AIT I Patterned Surface Defect Inspection System consisting

    • Manufacturer: KLA-Tencor
    • Model: AIT I

    KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...

    Decatur, GA
  • Trusted Seller
    NEW Takano WM-7SR Surface Particle

    NEW Takano WM-7SR Surface Particle Inspection System

    • Manufacturer: Takano
    • Model: WM-7

    TAKANO WM-7SR SURFACE PARTICLE INSPECTION SYSTEM consisting of:- Model: WM-7SR- Bare wafer surface defect inspection system- Substrate/Sizes: 2" - 8" Wafer Capable (Chuck and Carrier type dependent)- Substrate Th...

    Decatur, GA
  • Trusted Seller
    1997 KLA AIT I Main

    1997 KLA AIT I Main System

    • Manufacturer: KLA-Tencor
    • Model: AIT I

    Currently Configured for 6"/150mm & 8"/200mm Wafers Double Darkfield Inspection Tool SECS II/GEM Communication Interface Low Contact Chuck (AIT I) Multi Channel Collection Optics System with Independent Progr...

    United States
  • Nikon XT V130 MicroFocus X-Ray

    Nikon XT V130 MicroFocus X-Ray System

    • Manufacturer: Nikon

    Nikon XT V130 MicroFocus X-Ray System GUARANTEED WHOLE, COMPLETE, AND FULLY OPERATIONAL The system was de-installed in working operational condition. All returns must comply with the stated Return Policy. Pleas...

    Carpinteria, CA
  • ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION

    ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM

    • Manufacturer: Orbotech

    INFORMATION: ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM MODEL: FPI-7092 M SERIAL NO: SF 021005 DATE OF MFG: 06-2002 VOLTAGE: 120 VAC AMP: 32A FREQUENCY: 50/60 HZ The Orbotech FPI-7092 System is an AOI ...

    Santa Barbara, CA
  • KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM

    KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM W/ 4200 SMU

    • Manufacturer: Keithley
    • Model: 4200

    Information: 1) KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM 3) 4200 SMU CARDS The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time...

    Santa Barbara, CA
  • Texas Instruments AT 4070 Lead

    Texas Instruments AT 4070 Lead Inspection System Periodic Maintenance kit

    • Manufacturer: Texas Instruments

    Information: Texas Instruments AT 4070 Lead Inspection System Periodic Maintenance kit System was de-installed in working operational condition. All returns must comply with stated Return Policy. Please continue:...

    $49 USD
    Santa Barbara, CA
  • ORYX INSTRUMENTS SYSTEM 700-HMR ,

    ORYX INSTRUMENTS SYSTEM 700-HMR , ESD-QST M700HMR ESD TESTER

    • Manufacturer: ORYX INSTRUMENTS

    ORYX INSTRUMENTS SYSTEM 700-HMR , ESD-QST M700HMR ESD TESTER System was de-installed in working operational condition. All returns must comply with stated Return Policy. Please continue: PAYMENT OPTIONS: We accep...

    Santa Barbara, CA
  • HEWLETT PACKARD 16500C LOGIC ANALYSIS

    HEWLETT PACKARD 16500C LOGIC ANALYSIS SYSTEM 16500-40502 x3, 16555D Analyzer

    • Manufacturer: HP

    HEWLETT PACKARD 16500C LOGIC ANALYSIS SYSTEM 16500-40502 x3, 16555D Analyzer System was de-installed in working operational condition. All returns must comply with stated Return Policy. Please continue: PAYMENT O...

    $1,200 USD
    Santa Barbara, CA
  • Trusted Seller
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    KLA Tencor Altair 8935 Wafer Inspection System

    • Manufacturer: KLA-Tencor

    KLA Tencor Altair 8935 Wafer Inspection System consisting of: - Multiple Wafer Size Configurations Available - Manuals and Documentation - Please inquire for more information!

    Decatur, GA
  • Trusted Seller
    no-image_en.png

    KLA Tencor Altair 8920 Wafer Inspection System

    • Manufacturer: KLA-Tencor

    KLA Tencor Altair 8920 Wafer Inspection System consisting of: - Configured for 200/300mm - Manuals and Documentation - Please inquire for more information!

    Decatur, GA
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Overview

Semiconductor inspection and test equipment are specialized machines used to ensure the quality and functionality of semiconductor devices. These machines perform various tests and inspections, including visual inspection, electrical testing, and defect analysis, to identify and address any issues in the semiconductor manufacturing process. They are crucial in maintaining the high standards required in the semiconductor industry.

FAQ

What factors should I consider when buying semiconductor inspection and test equipment?

Consider the equipment's compatibility with your existing systems, the types of tests it performs, its accuracy, and the manufacturer's support and service options. Also, evaluate its overall condition and any included software or accessories.

How can I ensure safe shipping of semiconductor inspection and test equipment?

Use a specialized transport service experienced in handling delicate and high-value equipment. Ensure the equipment is properly packaged, secured, and insured during transit.

What maintenance is required for semiconductor inspection and test equipment?

Regular maintenance includes cleaning, calibration, and software updates. Follow the manufacturer’s guidelines for specific maintenance intervals and procedures to ensure optimal performance and longevity of the equipment.