Semiconductors » Test & Measurement (semiconductors)

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Used microscope

  • Trusted Seller
    2002 Nikon Eclipse LV150NA +

    2002 Nikon Eclipse LV150NA + NWL200 TWB Microscope

    • Manufacturer: Nikon
    • Model: NWL200

    Still installed in a fab. Working Condition. Vintage - LV150NA : 2002, NWL200 TWB : 2013 They are complete.

    Asia
  • Trusted Seller
    FEI Company Strata DB 235

    FEI Company Strata DB 235

    • Manufacturer: FEI
    • Model: STRATA DB 235

    FEI Company Strata DB 235 DualBeam FIB/SEM EQUIPMENT DETAILS: DescriptionRemarks Base FIB SystemFEI Dual Beam 235 Vintage Serial Number10101 Single or Dual Beam Ion ColumnDual Beam system Beam Energy30Kv Laser In...

    Bree, Ireland
  • Trusted Seller
    Olympus MX61L-F 300MM (14x12 stage)

    Olympus MX61L-F 300MM (14x12 stage) Semiconductor & Flat Panel Display Inspection Microscope

    • Manufacturer: Olympus

    Olympus MX61L-F 300MM (14x12 stage) Semiconductor & Flat Panel Display Inspection Microscope SERIAL NUMBER: OJ61979 01) Titling Trinocular Observation Tube 02) Clutch Driven Manual XY Stage with coaxial contro...

    Asia
  • Trusted Seller
    KLA-Tencor 0033116-002 Lens Alignment Assembly

    KLA-Tencor 0033116-002 Lens Alignment Assembly 0033233-001 Rev. 00 AIT UV Spare

    • Manufacturer: KLA-Tencor
    • Model: AIT

    “Removed from a KLA-Tencor AIT Fusion UV Darkfield Inspection System. The MMD Measurement Head Board PCB is not installed or included.” KLA-Tencor 0033116-002 Lens Alignment Assembly 0033233-001 AIT UV Used Worki...

    $801 USD
    Albuquerque, NM
  • Trusted Seller
    Sonoscan C-SAM Series D9000

    Sonoscan C-SAM Series D9000

    • Manufacturer: Sonoscan

    Sonoscan C-SAM Series D9000 Vintage 2002 EQUIPMENT DETAILS: Tool status: Shut down and moved to the warehouse. It is wrapped but not crated. Original PO Configuration. Audit to verify. VISUAL ACOUSTICS C-SAM DIGI...

    Bree, Ireland
  • Trusted Seller
    Electroglas 4085X Prober

    Electroglas 4085X Prober

    • Manufacturer: Electroglas
    • Model: 4085X

    High volume cassette to cassette wafer prober. 200mm Temptronic thermal inducing non-contacting Wafer Chuck Temptronic TP03010B-2100-1 Temperature Controller, with IEEE Interface * Wide Temperature range: 0° to +...

    Trim, Ireland
  • Trusted Seller
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    Nikon Optiphot 66 BD

    • Manufacturer: Nikon
    • Model: Optiphot 66

    Nikon fluorescence microscope Optiphot 66 BD. Objectives for brightfield and darkfield 10x/20x/50x/100x. Bright-field microscope.

    Burladingen, Germany
  • Trusted Seller
    Teradyne UltraFLEX TSK UF3000EX 2sets

    Teradyne UltraFLEX TSK UF3000EX 2sets available quipement semi-conducteur used semiconductor equipment

    • Manufacturer: Teradyne

    TSK UF-3000EX UF-3000EX Configuration DATE 2008/Feb 2007/Nov Voltage 200V 200V Hot Chuck Controller Ambient/Hot(30~150) Ambient/Hot(30~150) Gold Chuck X X Nickel Chuck V V Temperature Controller V V Hard Drive V ...

    Bree, Ireland
  • Trusted Seller
    XYZTEC Condor 150-3

    XYZTEC Condor 150-3

    • Manufacturer: XYZTec
    • Model: Condor 150-3

    Pull- and Shear Tester Complete with all parts what you can see on the photo. Excellent condition - with Workholder - 4 way Head ( 2 x Pulltest: 2N, 20N / 2 x Sheartest: 20N, 100N) - with Microscope - with ...

    Europe
  • Trusted Seller
    LEITZ ERGOLUX AMC -LIS

    LEITZ ERGOLUX AMC -LIS

    • Manufacturer: Leitz

    Inspection microscopes with automatic plate loading/unloading module LIS plate assembly 150mm As is. Lenses: NPL Fluotar 5x/0,09 NPL Fluotar 10x/0,22 DF NPL Fluotar 20x/0,45DF NPL Fluotar 100x/0,90DF

    Europe
  • Metallographic Microscope JX22/JX23

    Metallographic Microscope JX22/JX23

    • Manufacturer: ASIDA

    ASIDA metallographic microscope is used in measurement and analysis of tiny-size objects like IC components and microsections. Metallographic Microscope JX22/JX23 sample : · Optimal optical path to ensure best im...

    Dongguan, China
  • Trusted Seller
    2005 F&S BONDTEC (Delvotec) 5610

    2005 F&S BONDTEC (Delvotec) 5610

    • Manufacturer: F&S BONDTEC (Delvotec)

    Semi-automatic gold-ball wirebonder with pull & shear heads. Specifications: Mechanics X, Y table Working area 100 x 115 mm Resolution 0.25 μm, repeatability < 2 μm Z-axis 60 mm speed up to 20 wires / mi...

    Erfurt, Germany
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    Nikon OPTIPHOT-200D Microscope Assembly

    • Manufacturer: Nikon
    • Model: Optiphot 200

    Optical microscope assembly

    Yongin-si, South Korea
  • Trusted Seller
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    BOOM STAND BOOM STAND

    • Manufacturer: Unknown

    BOOM STAND BOOM STAND Microscope Boom Stand Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with ...

    Bree, Ireland
  • Trusted Seller
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    BOOM STAND BOOM STAND

    • Manufacturer: Unknown

    BOOM STAND BOOM STAND Microscope Boom Stand Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with ...

    Bree, Ireland
910111213

Overview

Semiconductor inspection and test equipment are specialized machines used to ensure the quality and functionality of semiconductor devices. These machines perform various tests and inspections, including visual inspection, electrical testing, and defect analysis, to identify and address any issues in the semiconductor manufacturing process. They are crucial in maintaining the high standards required in the semiconductor industry.

FAQ

What factors should I consider when buying semiconductor inspection and test equipment?

Consider the equipment's compatibility with your existing systems, the types of tests it performs, its accuracy, and the manufacturer's support and service options. Also, evaluate its overall condition and any included software or accessories.

How can I ensure safe shipping of semiconductor inspection and test equipment?

Use a specialized transport service experienced in handling delicate and high-value equipment. Ensure the equipment is properly packaged, secured, and insured during transit.

What maintenance is required for semiconductor inspection and test equipment?

Regular maintenance includes cleaning, calibration, and software updates. Follow the manufacturer’s guidelines for specific maintenance intervals and procedures to ensure optimal performance and longevity of the equipment.