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NEW Takano WM-7SR Surface Particle Inspection System
- Manufacturer: Takano
- Model: WM-7
TAKANO WM-7SR SURFACE PARTICLE INSPECTION SYSTEM consisting of:- Model: WM-7SR- Bare wafer surface defect inspection system- Substrate/Sizes: 2" - 8" Wafer Capable (Chuck and Carrier type dependent)- Substrate Th...
Decatur, GA Tektronix 576
- Manufacturer: Tektronix
- Model: 576
The 576 Curve Tracer is a rugged high power measurement system for tests on 2and 3-terminal discrete semiconductors. With a collector supply of up to 220 W peak, adjustable current limiting is provided in the ste...
$4,997 USDFarmingdale, NJAgilent/Keysight 4155C
- Manufacturer: Agilent - Keysight
- Model: 4155C
The Agilent 4155C Semiconductor Parameter Analyzer is a cost-effective, accurate laboratory benchtop solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V and add...
$16,997 USDFarmingdale, NJ2012 Advantest T6373 ND3
- Manufacturer: Advantest
- Model: T6373 ND3
Working Condition ND3 Test Systems. (2) Available with 2-3 week lead time. Excellent See PDF for Configuration.
Grayslake, ILAgilent/Keysight 4156C
- Manufacturer: Agilent - Keysight
- Model: 4156C
The Agilent 4156C Precision Semiconductor Parameter Analyzer is a highly accurate laboratory benchtop solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V and ad...
$18,997 USDFarmingdale, NJ- Trusted Seller
Instron 2820-036 variable angle peel test fixture- NEW UNUSED
- Manufacturer: Instron
Instron 2820-036 variable angle peel test fixture- NEW UNUSED
United States Advantest T2000 LS
- Manufacturer: Advantest
- Model: T2000LS
T2000LS with (8) BPS-034449X03 800DM’s | (2) BPS-035792 DPS150A | (1) BPS-034491 PMU32 Good Working Condition/Off-Line T2000LS with (8) BPS-034449X03 800DM’s | (2) BPS-035792 DPS150A | (1) BPS-034491 PMU32
Grayslake, IL2004 Advantest V93000 PS800 STH
- Manufacturer: Advantest
- Model: V93000
PCI-E | DUT Scale | SMT 6.5.x Software | (24) PS800 CBs | (8) DCDC | (3) ACDC | (4) MSDPS | (1) Manipulator | (1) E2760FA Cooling Unit | XW8200 Computer Fully working PS800 STH. Remote inspection and install warr...
Grayslake, IL2019 TSK UF3000LX
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF3000LX
Working Condition UF3000LX. Power On Demo available. Comes with ND4 Docking Kit. Configured to dock with ND4. Please see PDF for full configuration.
Grayslake, IL2018 TEL Precio
- Manufacturer: Tokyo Electron - TEL
- Model: Precio
Like New Tri Temp Precio Probers, never used in production. Temp Range -°25 Good Working Condition/Off-Line TEL Precio (vintage 2018) Dual FOUP Interface Wafer size (mm) 200,300 Stage technology ...
Grayslake, IL2013 Advantest T2000LS
- Manufacturer: Advantest
- Model: T2000LS
T2000 LS with RF Option T2000LS with RF Option - Please see PDF for configuration.
Grayslake, IL2016 Advantest Advantest T5832
- Manufacturer: Advantest
- Model: T5832
Working Condition T5832 Production System. 1/2 Config Excellent
Grayslake, IL2012 Teradyne J750
- Manufacturer: Teradyne
- Model: J750
(4) 512 TH J750 Testers/ (1) 1024 TH Working Condition with Manipulator and Power Transformer. Configurable depending on availability. (8) HSD100 | (4) MTO | (4) DPS | (1) CTO | (1) CUB (8) HSD100 | (4) MTO | (...
Grayslake, IL2019 TSK UF3000LX
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF3000LX
Working Condition UF3000LX. Power On Demo available. Comes with ND4 Docking Kit. Configured to dock with ND4. Please see PDF for full configuration.
Grayslake, IL2004 Advantest V93000 PS800 STH
- Manufacturer: Advantest
- Model: V93000
PCI-E | non-DUT Scale | SMT 6.5.x Software | (24) PS800 CBs | (8) DCDC | (3) ACDC | (4) MSDPS | (1) Manipulator | (1) E2760FA Cooling Unit | XW8200 Computer Fully working PS800 STH. Remote inspection and install ...
Grayslake, ILCDE Resmap Test & Measurement (semiconductors)
- Manufacturer: CDE
- Model: Resmap
Good condition CDE Resmap Test & Measurement (semiconductors)s. Located in USA and other countries. Click request price for more information.
USA