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- Trusted Seller
Zeiss/HSEB Axiospect 300 Automated Wafer Inspection and Review station for 200mm/300mm wafers
- Manufacturer: HSEB
Wafer inspection/review station for bare and patterned wafers Inspect 300mm wafers in FOUP loaders or 200mm wafers in open cassetes with adaptors 2 FOUP loaders Axiotron 300 microscope Equipe robot with PRE-5...
United States - Trusted Seller
KLA-Tencor Corp. Surfscan SP2.5+
- Manufacturer: KLA-Tencor
- Model: Surfscan SP2
Particle Measurement Metrology Equipment Currently Configured for: 300mm · Defect Inspection · Two Load Ports · SECS/GEM Capability · Integration to Klarity/UDB · Auto DSA · High resolution 3D imaging of ...
United States - Trusted Seller
RUDOLPH FE-VII-D, Focus Ellipsometer
- Manufacturer: Rudolph
RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...
United States 
ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM
- Manufacturer: Orbotech
INFORMATION: ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM MODEL: FPI-7092 M SERIAL NO: SF 021005 DATE OF MFG: 06-2002 VOLTAGE: 120 VAC AMP: 32A FREQUENCY: 50/60 HZ The Orbotech FPI-7092 System is an AOI ...
Santa Barbara, CA- Trusted Seller
Trim, Ireland - Trusted SellerTrim, Ireland
KLA-Tencor Model AIT XP Darkfield Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT XP
The KLA-Tencor AIT XP+ Patterned Wafer Inspection system is designed to meet the needs of 0.13um and beyond design rule processes. Based on the highly popular AIT series, the AIT XP+ incorporates Mixed Mode Detec...
San Jose, CA- Trusted Seller
Altek Process Voltage Analyzer
- Manufacturer: Altek
Trim, Ireland 
KLA-Tencor AIT I (8020)
- Manufacturer: KLA-Tencor
- Model: AIT I
A double darkfield patterned wafer inspection tool. Features: Automated wafer inspection system Double-dark field (DDF) laser scanning technology High detection sensitivity even for difficult after-etch, develop,...
San Jose, CA
Zeiss/HSEB Axiospect 300 Automated Wafer Inspection and Review station for 200mm/300mm wafers
- Manufacturer: HSEB
Wafer inspection/review station for bare and patterned wafers Inspect 300mm wafers in FOUP loaders or 200mm wafers in open cassetes with adaptors 2 FOUP loaders Axiotron 300 microscope Equipe robot with PRE-5...
$37,500 USDSan Jose, CA
KLA-Tencor Surfscan 7700 Wafer Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 7700
A patterned and unpatterned wafer inspection and can accommodate wafers between 4" to 8". Features: High sensitivity on after-ech and high topography applications Dual collection channels Circular input polarizat...
San Jose, CA
KLA-Tencor AIT I In-Line Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT I
Automated full water inspection system for detecting particles as small as 0.10 micrometers on bare silicon and patterned process wafers Features: High detection sensitivity even for difficult after-etch, develop...
San Jose, CAERSA PL550A
- Manufacturer: Ersa
ERSA - PL550A - Placement system with camera SMD precision placement system with integrated x/y PCB table reflow process camera VSRPC with swivel arm dimmable LED ring light 230 V - 20 W
Farmingdale, NJAgilent/Keysight N2502B
- Manufacturer: Agilent - Keysight
Key Features: Shorten TACT (total average cycle time) with the industry-highest speed TFT array test function Utilize flexible and unlimited channel expandability to maximize ROI (return on investment) Customize ...
Farmingdale, NJ
KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM W/ 4200 SMU
- Manufacturer: Keithley
- Model: 4200
Information: 1) KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM 3) 4200 SMU CARDS The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time...
Santa Barbara, CA