Used continuous

LINEAR LAB C-500 C-1MV/OC ARCO SOLAR METROLOGY

INCLUDES: LINEAR LAB C-500 C-1MV/OC ARCO SOLAR METROLOGY System was de-installed in working operational condition. All returns must comply with stated Return Policy. Please continue: PAYMENT OPTIONS: We accept Pa...

NEWPORT SOLAR SIMULATOR

• Manufacturer: Newport

NEWPORT SOLAR SIMULATOR 91193-1000 NEWPORT POWER SUPPLY 69920 NEWPORT 68945 DIGITAL EXPOSURE CONTROL SOLAR SIMULATOR CABLES System was de-installed in working operational condition. All returns must comply with s...

NIKON OPTIPHOT 200 Wafer Inspection Scope with Trinocular ergonomic Head with Nikon objective 5x, 10x CF Plan, Nikon 50x, and Nikon 100x CF Plan

• Manufacturer: Nikon
• Model: Optiphot 200

Information:­­­­­­­ NIKON OPTIPHOT 200 Wafer Inspection Scope with Trinocular ergonomic Head with Nikon objective 5x, 10x CF Plan, Nikon 50x, and Nikon 100x CF Plan Equipment demonstrations available upon reque...

TEXTOOL 228-1277-00 with GORE RELIABILITY TEST BOARD 90000164 REV.0

• Manufacturer: TEXTOOL

INFORMATION TEXTOOL 228-1277-00 with GORE RELIABILITY TEST BOARD 90000164 REV.0 System was de-installed in working operational condition. All returns must comply with stated Return Policy. Please continue: PAYMEN...

ORTEC EG&G "719 Timer" NIM MODULE

• Manufacturer: ORTEC

Includes: ORTEC EG&G "719 Timer" NIM MODULE System was de-installed in working operational condition. All returns must comply with stated Return Policy. Please continue: TAXES & FEES: California Sales Tax applies...

US ENGINEERING NS-6040 TEST HANDLER KIT FOR 19X19 BGA

• Manufacturer: US ENGINEERING

INCLUDES: US ENGINEERING NS-6040 TEST HANDLER KIT FOR 19X19 BGA System was de-installed in working operational condition. All returns must comply with stated Return Policy. Please continue: PAYMENT OPTIONS: We ac...

CASCADE ALESSI REL-6100

• Manufacturer: Alessi
• Model: REL-6100

DESCRIPTION: CASCADE ALESSI REL-6100 PROBE STATION WITH: Ezlaze 3 laser cutting system 4 working long distance objectives (1) is a UV objective Joystick controller New wave fiber optic light source ecx-56 expansi...

ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM

• Manufacturer: Orbotech

INFORMATION: ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM MODEL: FPI-7092 M SERIAL NO: SF 021005 DATE OF MFG: 06-2002 VOLTAGE: 120 VAC AMP: 32A FREQUENCY: 50/60 HZ The Orbotech FPI-7092 System is an AOI ...

MICROMANIPULATOR 6200 MANUAL PROBING STATION

• Manufacturer: Micromanipulator

Information: MICROMANIPULATOR 6200 MANUAL PROBING STATION Micromanipulators 6200 series is the most widely used probe station by any manufacturer. Compatible with Micromanipulators extensive line of probes and ac...

Sopra Ellipsometer GXR

SOPRA ELIPSOMETER MANUFACTURER: SOPRA MODEL : GXR Description: SOPRA has developed a new approach by combining two non-destructive characterization techniques on the same instrument: Spectroscopic Ellipsometry (S...

KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM W/ 4200 SMU

• Manufacturer: Keithley
• Model: 4200

Information: 1) KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM 3) 4200 SMU CARDS The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time...

Agilent/Keysight PD1550A

• Manufacturer: Agilent - Keysight

The JEDEC standards recognized the need to provide WBG standards for the power semiconductor industry. In September of 2017, the JC70 Wide Bandgap Power Electronic Conversion Semiconductor committee was formed fo...

Agilent/Keysight PD1500A

• Manufacturer: Agilent - Keysight

The JEDEC standards recognized the need to provide WBG standards for the power semiconductor industry. In September of 2017, the JC70 Wide Bandgap Power Electronic Conversion Semiconductor committee was formed fo...

Tektronix 576

• Manufacturer: Tektronix
• Model: 576

Details The Tektronix 576 is a high-voltage curve tracer designed for advanced semiconductor testing. It supports up to 1,500V collector supply, pulse and continuous testing modes, and multiple measurement format...