Used performance testing

KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM W/ 4200 SMU

• Manufacturer: Keithley
• Model: 4200

Information: 1) KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM 3) 4200 SMU CARDS The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time...

Guzik 32R1550R 303460 Rev C Head Amplifier Pneumatic Veeco Spinstand (5239)

• Manufacturer: Veeco - Sloan

Guzik 32R1550R 303460 Rev C Head Amplifier Pneumatic Veeco Spinstand (5239)w Good cosmetic condition with some signs of use. Unable to test. See pictures for more detail. - Manufacturer: Guzik Head Amplifier - ...

SensArray, KLA Tencor 2005A-0002 Single Process Probe Instrumented Wafer (7641)W

• Manufacturer: KLA-Tencor

SensArray, KLA Tencor 2005A-0002 Single Process Probe Instrumented Wafer (7641)W Item is in good cosmetic condition and in original box. Please see photos for what is included as may be missing parts. No further ...

OPTEM DIG1004 Optics Module Assembly Unit with Two Sony XC-ES30 CCD Cameras 8501

• Manufacturer: Sony

model: Optem _MISSING_ img{max-width:100%} OPTEM DIG1004 Optics Module Assembly Unit with Two Sony XC-ES30 CCD Cameras (8501)RIn good cosmetic condition. Taken from a working environment. See pictures for more d...

Nanoscope Controller for Vx310 AFP Dimension 9000M/9300M Microscope Bruker 10814

• Manufacturer: Bruker

Nanoscope Controller for Vx310 AFP Dimension 9000M/9300M Microscope (10814) Unable to test, removed from working system, 30 day right of return - Manufacturer: Digital Instruments, Veeco, Bruker, DI - Model: D...

Research Devices M8 Visible Flip Chip Aligner Bonder For Parts (9280)R

• Manufacturer: Research Devices

Research Devices M8 Visible Flip Chip Aligner Bonder For Parts (9280)R For Parts In good cosmetic condition. Taken from a working environment. We believe this unit is in working condition. Unable to test further....

Sopra Ellipsometer GXR

SOPRA ELIPSOMETER MANUFACTURER: SOPRA MODEL : GXR Description: SOPRA has developed a new approach by combining two non-destructive characterization techniques on the same instrument: Spectroscopic Ellipsometry (S...

Rudolph Research FE-III Focus Ellipsometer

• Manufacturer: Rudolph
• Model: FE-III

The FE-III has fully automatic operation and a scanning stage. Unique optical and detection systems measure ellipsometric parameters over an angle range of 40 to 70 degrees simultaneously, giving more flexibility...

Rudolph AutoEL Automatic Ellipsometer SS1 4D for Parts (10092)

• Manufacturer: Rudolph

Rudolph AutoEL Automatic Ellipsometer SS1 4D for Parts (10092) Powers on, Reads Right Sensor Not Found, For Parts, Only Items Pictured Are Included - Manufacturer: Rudolph - Model: AutoEL SS1 with 4D Option -...

Nordson DAGE 4000-BS250 Cartridge Shear Ball Linear (9373)K

• Manufacturer: Nordson DAGE
• Model: 4000

Nordson DAGE 4000-BS250 Cartridge Shear Ball Linear. Used (9373)K In good cosmetic condition. In original packaging and within calibration date. This item was a spare cartridge that was part of a working system. ...

Motorized XY Axis & Rotary Vacuum Stage 4” Wafer Inspection Chuck USED (9011)R

• Manufacturer: unbranded

Motorized XY Axis & Rotary Vacuum Stage 4” Wafer Inspection Chuck USED (9011)R In good cosmetic condition. Taken from a working environment. This item was taken from a working Rudolph August NSX 95 system, we ha...

Agilent/Keysight PD1500A

• Manufacturer: Agilent - Keysight

The JEDEC standards recognized the need to provide WBG standards for the power semiconductor industry. In September of 2017, the JC70 Wide Bandgap Power Electronic Conversion Semiconductor committee was formed fo...