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- Trusted Seller
Spea 3030IL Dual bay
- Manufacturer: SPEA
For more information regarding stock and pricing, please click here. Spea 3030IL dual bay in excellent condition. Vintage 2006 The 3030IL is the fully automatic bed-of-nails tester expressly designed to minimize ...
Veenendaal, Netherlands Module-Level Burn-in
Input/ output options: JEDEC Tray | Selection of packages: Silicon Carbide (SiC), Gallium Nitride (GaN) Power devices | Channel number: Up to 720 power device burn-in test parallelism | Burn-in duration: Program...
Penang, Malaysia
Agilent/Keysight 4155C
- Manufacturer: Agilent - Keysight
- Model: 4155C
The Agilent 4155C Semiconductor Parameter Analyzer is a cost-effective, accurate laboratory benchtop solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V and add...
Agilent/Keysight 4156C
- Manufacturer: Agilent - Keysight
- Model: 4156C
The Agilent 4156C Precision Semiconductor Parameter Analyzer is a highly accurate laboratory benchtop solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V and ad...
- Trusted Seller
National Instruments 777959-01
- Manufacturer: National Instruments
777959-01 | PCI-1422, 16-Bit, Parallel Digital, Image Acquisition Board
Cary, NC 
Wafer-Level Burn-in
Chuck quantity: Octa Chuck | Package type: Silicon Carbide (SiC) Power Device | Wafer size: 6, 8 inch | Input/ output option: Wafer Cassette (Up to 2 cassettes) | Die per wafer burn-in parallelism: 4000 | Total ...
Penang, Malaysia- Trusted Seller
KLA Tencor Surfscan 6200 Particle Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
KLA-TENCOR SURFSCAN 6200 PARTICLE INSPECTION SYSTEM consisting of:- Model: 6200 Surfscan- Particle Inspection System- Max Wafer Capable: 8”/200mm- System configured for 8“/200mm wafers- Defect Sensitivity: 0.12um...
Decatur, GA - Trusted Seller
2019 Viscom X7056RL AOI/AXI
- Manufacturer: Viscom
Model: X7056RL 3D X-ray Inspection Simultaneous Optical and X-ray Inspection Selectable Resolution The Viscom X7056 combines high-performance AOI with parallel AXI, in a family of inspection systems. The RL versi...
Magnolia, TX Discrete-Level Test
Input options: Vibrator Bowl, Plastic Tube Stacker | Output options: Tape & Reel, Plastic Tube Stacker | Test capabilities: Electrical Functional Test, Open Short Test, Insulation test | Test site: Dual Test Sit...
Penang, Malaysia
Tektronix 4210-SMU/PA-R^
- Manufacturer: Tektronix
- Model: 4210-SMU
The Keithley High Power Source-Measure Unit for 4200-SCS. 1A to 100fA, 200V to 1µV, 20 Watt. Voltage error when using the ground unit is included in the Keithley 4210-SMU. The Keithley is four-quadrant source/sin...
Cyberoptics 3D AOI SQ3000
- Manufacturer: AOI
SQ3000™ FASTEST 3D AOI IN THE INDUSTRY DESCRIPTION: The Ultimate in Speed and Accuracy. SQ3000 3D Automated Optical Inspection (AOI) system maximizes ROI and line utilization with 3D multi-view sensors that enabl...
Shenzhen, China
Cyberoptics Automatic Optical Inspection 3D AOI SQ3000
- Manufacturer: Cyberoptics
- Model: SQ3000
Product details Payment &Shipping terms 3D automatic optical inspection system The Ultimate in Speed and Accuracy. SQ3000 3D Automated Optical Inspection (AOI) system maximizes ROI and line utilization with 3D mu...
Shenzhen, China- Trusted Seller
ACCRETECH TSK UF3000
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF3000
ACCRETECH / TSK UF3000 Production Wafer Prober EQUIPMENT DETAILS: tool was ‘initialized’ successfully recently. -Functional are ok for small array probe card -For large array probe card may have issue with sh add...
Bree, Ireland - Trusted Seller
Accretech TSK UF200SA
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF200SA
Accretech TSK UF200SA Wafer Prober x 7 Sets Available June 2015 Main Control System Hard Disk Drive 3-1/2″ Floppy Disk Drive Magneto Optical Disk Drive Head Stage Single Cassette Loaders for 25 Wafers (6- to 8-in...
Bree, Ireland Agilent/Keysight U9405B
- Manufacturer: Agilent - Keysight
The enhanced Keysight Flexicore i1000 ICT system with parallel test capability addresses key increasing trends in manufacturing while retaining all previous features. With the increased depth and built-in instrum...
Farmingdale, NJ
