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Universal Instruments Readout Assy 45326501 Rev E. Schaevitz MP-1000
- Manufacturer: Universal Instruments
“Brand new in opened packaging” Brand new never used Schaevitz MP Series Microprocessor-Based LVDT Readout/Controller in original packaging. UIC Part Number 45326501 Rev E. 4Tech Electronics Contact Info To find ...
$800 USDWebberville, MIUniversal Instruments Readout Assy 45326501 Schaevitz MP-1000
- Manufacturer: Universal Instruments
“Brand new in opened packaging” Brand new never used Schaevitz MP Series Microprocessor-Based LVDT Readout/Controller in original packaging. 4Tech Electronics Contact Info To find out about current specials or pa...
$1,000 USDWebberville, MI- Trusted Seller
ICS 9301-10P Patterned Wafer Defect Tool Auto Range Input 115/230V 50/60Hz 8....
- Manufacturer: ICS
“USED, IN NICE CONDITION. WAS IN WORKING CONDITION WHEN TAKEN OUT OF SERVICE. SEE PICTURES ATTACHED” ICS 9301-10P Patterned Wafer Defect Tool Auto Range Input 115/230V 50/60Hz 8.0/4.0A ICS 9301-10P Patterned Wafe...
$3,500 USDFleetwood, PA 
KLA TENCOR P10
- Manufacturer: KLA-Tencor
- Model: P-10
Information: KLA TENCOR P10 KLA / TENCOR P10 Wafer Testing and Metrology Equipment is a user-friendly, automated, and flexible metrology system designed to meet the particular needs of semiconductor and ...
- Trusted Seller
INTEGRATED PROCESS 2000-700903
- Manufacturer: Unknown
INTEGRATED PROCESS 2000-700903 GAUGE, DOWN, FORCE 30 day parts warranty on all new parts. Available 2017
Bree, Ireland - Trusted Seller
ASSOCIATED PROCESS CONTROL 32-24177S
- Manufacturer: Unknown
Bree, Ireland - Trusted Seller
HITACHI ASIA HISCO S-7800
- Manufacturer: Hitachi
- Model: S-7800
HITACHI (ASIA HISCO) S-7800 S-7800 Wafer Process Evaluation SEM 200 mm Vintage 2008
Bree, Ireland - Trusted Seller
Nanometrics NANOLINE III
- Manufacturer: Nanometrics
Nanometrics NANOLINE III NANOMETRICS CRITICAL DIMENSION COMPUTER Critical Dimension Computer Large memory digital computer calculates line widths and provides statistics on in process wafer and photomasks.
Bree, Ireland - Trusted Seller
KLA-Tencor 7700
- Manufacturer: KLA-Tencor
KLA-Tencor 7700 KLA-TENCOR PATTERNED WAFER CONTAMINATION ANALYZER Patterned Wafer Contamination Analyzer Detects defects as small as 0.15 µm, while defects below 0.2 µm can be detected on many process levels, inc...
Bree, Ireland 
KIC KIC Wave Curve Measuring Device
- Manufacturer: KIC
For precise temperature measurement process performance, KIC software uses the Process Window Index (PWI). PWI is a simple value that objectively reflects, from a mathematical perspective, whether the measured te...
Taiwan
KIC SPS smart profiler
- Manufacturer: KIC
SPS Intelligent Temperature Measurement Instrument combines the industry-winning excellent operation software PS 2G by KIC, and Navigator Power and Auto-Focus Power process optimization software, to build a progr...
Taiwan
Shimadzu SMX-1010/1020
- Manufacturer: Shimadzu
The automated teaching function for continuous through-vision and the feed-increment function can reduce operator workload and inspection time. Here we introduce the teaching function. The figure below shows the ...
TaiwanPEMTRON TROI-7700E
- Manufacturer: PEMTRON
Through improving camera inspection speed, TROI can achieve the same testing performance as a single 3D projection. Based on AOI technology experience, PEMTRON first introduces the SPI standard component library ...
Taiwan
SDI/SEMILAB FAaST 200 SL
- Manufacturer: Semilab
- Model: FAAST 200 SL
non-contact electrical C-V & I-V measurement system capable of measuring on product wafers. Measurements can be made in scribe line test sites or in the active cell area. Cell measurements allow for the first ti...
Cheonan-si, South Korea
Veeco Dektak V 200-S
- Manufacturer: Veeco - Sloan
- Model: Dektak
Vintage : 0000 Process : Surface Profile Maker : Veeco Model : Dektak V 200-SL Condition : Used Surface Profile
Gyeonggi-do, South Korea
