Semiconductors » Metrology / Inspection (semiconductors)

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17

Used console

  • APPLIED MATERIALS OPERATOR CONSOLE VERASEM

    APPLIED MATERIALS OPERATOR CONSOLE VERASEM 3D U-571

    • Manufacturer: Amat
    • Model: VeraSEM

    Information: APPLIED MATERIALS OPERATOR CONSOLE VERASEM 3D U-571 System was de-installed in working operational condition. All returns must comply with stated Return Policy. Please continue: PAYMENT OPTIONS: We a...

    Santa Barbara, CA
  • Trusted Seller
    Sloan/Veeco Dektak IIA

    Sloan/Veeco Dektak IIA

    • Manufacturer: Veeco - Sloan
    • Model: Dektak

    Specifications Measurement Display Range … 200 A to 655,000 A (20nm to 65,000nm) Vertical Resolution … 5A (.5nm) Scan Length … 50 microns to 30mm Scan time … .4 to 65 seconds (depending on scan length and speed r...

    Billerica, MA
  • Trusted Seller
    Sloan/Veeco Dektak IIA

    Sloan/Veeco Dektak IIA

    • Manufacturer: Veeco - Sloan
    • Model: Dektak

    Specifications Measurement Display Range … 200 A to 655,000 A (20nm to 65,000nm) Vertical Resolution … 5A (.5nm) Scan Length … 50 microns to 30mm Scan time … .4 to 65 seconds (depending on scan length and speed r...

    Billerica, MA
  • Trusted Seller
    Thermo Noran 170A141781 MADC BD

    Thermo Noran 170A141781 MADC BD 512-068800 700P135927 AMAT SemVision cX Used

    • Manufacturer: Amat
    • Model: Semvision

    Thermo Noran 170A141781 MADC BD 512-068800 700P135927 AMAT SemVision cX used working Inventory # AA-12148 This Thermo Noran 170A141781 MADC BD is used working surplus. The physical condition is good, but there a...

    $506 USD
    Albuquerque, NM
  • Trusted Seller
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    Varian Console with a SMS 50 Autosampler

    • Manufacturer: Varian

    Varian Console with a SMS 50 Autosampler Console with a SMS 50 Autosampler

    Bree, Ireland
  • Trusted Seller
    KLA-Tencor Corp. Archer 500 AIM

    KLA-Tencor Corp. Archer 500 AIM SCOL

    • Manufacturer: KLA-Tencor

    5 available 300mm Overlay Measurement System Metrology Equipment Archer 500 AIM main components- integrated console inspection station equipment frond end module (EFEM) Optics system HLS (halogen light s...

    Europe
  • Trusted Seller
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    KLA Tencor EV-300 Defect Review

    • Manufacturer: KLA-Tencor

    Open Cassette with Genmark single end-effector robot, Cassette Type - Dual 8" Open Cassette, Camera - 1 High MAG & 2 Low MAG, with EDX in box and Line Conditioner; with Dry pump console powered box and vac-pump i...

    Trim, Ireland
  • Trusted Seller
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    SEM Critical Dimension CD Measurement

    • Manufacturer: Unknown

    NANOSEM 3D Metrology System Description Part Number ——————————————– CD-SEM Metrology System NANOSEM 3D 300mm Wafer Handling – FOUP 25 wafers x 3 ports NANO3D-EWH6 Lens – FOV 450 and FOV 6000 NANO3D-LENS1 Standing...

    Bree, Ireland
  • Trusted Seller
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    Overlay Measurement System

    • Manufacturer: Unknown

    System to include the following: Archer AIM-03 Dual Fims Fully automated overlay measurement module including coherence probe interference microscope and automated wafer handling – measures BiB and AIM Grating ta...

    Bree, Ireland
  • Trusted Seller
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    SEM Defect Review DR

    • Manufacturer: Unknown

    • Currently configured for 300mm (12in) wafer sizes • MFG Date: 2007 • Install Type: Stand-Alone • Factory Interface (FI): o FI version: 5.3+ o (2) 300mm TDK TAS300 FOUP load-ports ? 25-slot FOUP support o Wafer ...

    Bree, Ireland
  • Trusted Seller
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    SEM Critical Dimension CD Measurement

    • Manufacturer: Unknown

    • Currently configured for 300mm (12”) wafer sizes • MFG Date: 2006 • CE Marked • Install Type: Stand-Alone • Cassette Interface (FI): o (3) 300mm TDK TAS300-F1 FOUP load-ports o Wafer Handling Robot (Track): Bro...

    Bree, Ireland
  • Trusted Seller
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    APPLIED MATERIALS SEMVISION G4

    • Manufacturer: Amat
    • Model: Semvision

    APPLIED MATERIALS SEMVISION G4 EQUIPMENT DETAILS: • Currently configured for 300mm (12in) wafer sizes • MFG Date: 2007 • Install Type: Stand-Alone • Factory Interface (FI): o (2) 300mm TDK TAS300 FOUP load-ports ...

    Bree, Ireland
  • Trusted Seller
    1996 KLA KLA-5100XP

    1996 KLA KLA-5100XP

    • Manufacturer: KLA-Tencor
    • Model: 5100XP

    Overview of relevant items such as chambers, Smiff interface, gases, etc See attached sheet of "Configuration" Warehouse or Clean Room Warehouse Clean Room Options: Running production, Idle, Decontaminated, Dec...

    Asia
  • Trusted Seller
    1996 KLA KLA-5100XP

    1996 KLA KLA-5100XP

    • Manufacturer: KLA-Tencor
    • Model: 5100XP

    Wafer Size (6'', 8'', 12'', …) 8" Process Superposition measuring device Location Warehouse or Clean Room Warehouse Status Clean Room Options: Running production, Idle, Decontaminated, Decomissioned Warehouse...

    Asia
  • 1994 BIO-RAD QS-300

    1994 BIO-RAD QS-300

    • Manufacturer: Bio-Rad
    • Model: QS-300

    ■ Capable 4" to 8" Wafer ■ Optical Console - Michelson Interferometer - KBr Beam split / - DTGS Detector & Element - He-Ne Laser & IR Source ■ Wafer Tray / Nose cone - Wafer Size : up to 8" / - Ruler increm...

    Cheonan-si, South Korea
12

Overview

Semiconductor metrology involves the measurement and analysis of semiconductor wafers and devices. This category includes tools and equipment used to ensure the precision and accuracy of semiconductor manufacturing processes. These instruments are vital for quality control, helping to detect defects and ensure that devices meet strict industry standards.

FAQ

What factors should I consider when buying semiconductor metrology equipment?

Consider the equipment's measurement accuracy, resolution, and compatibility with your specific semiconductor processes. Evaluate the vendor's support services and the equipment's ease of integration into your existing systems.

How can I ensure safe shipping of semiconductor metrology equipment?

Use a specialized shipping service experienced in handling sensitive and high-precision equipment. Ensure the equipment is well-packaged with proper cushioning and handling instructions.

What is the maintenance schedule for semiconductor metrology equipment?

Regular calibration and inspection are essential. Follow the manufacturer's guidelines for preventative maintenance, including cleaning optical components and checking for software updates. Maintain a log of all maintenance activities.