Semiconductors » Metrology / Inspection (semiconductors)

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Used controllers/interfaces

  • Suss PH600HF High Frequency Positioners

    Suss PH600HF High Frequency Positioners (set of 4)

    • Manufacturer: SÜSS MicroTec

    set of 4 programmable positioners, north, south, east, west includes cables and interface boards for PA200 prober controller see attached specification sheet

    $9,950 USD
    San Jose, CA
  • Kaye Instruments X2015 409725

    Kaye Instruments X2015 409725

    • Manufacturer: Kaye

    The Kaye Validator X2015 Validation System by Kaye Instruments is a precision temperature validation instrument designed for accurate and reliable temperature mapping and validation. It includes the main Validato...

    Murrieta, CA
  • Suss Microtech PH500 Motorized Micropositioners

    Suss Microtech PH500 Motorized Micropositioners

    • Manufacturer: SÜSS MicroTec

    PH500 programmable micropositioner includes cables and interface boards for PA200 prober controller vacuum base 5um step size 4 available 25mm xy range 10mm Z range

    $2,950 USD
    San Jose, CA
  • Kaye Instruments X2015 409726

    Kaye Instruments X2015 409726

    • Manufacturer: Kaye

    The Kaye Validator X2015 Validation System is a precision temperature validation instrument designed for calibration and validation tasks. It includes the main X2015 unit, a CTR-80 temperature controller, and a c...

    Murrieta, CA
  • Advanced Instruments Inc. 3300 407076

    Advanced Instruments Inc. 3300 407076

    • Manufacturer: Advanced Instruments
    • Model: 3300

    Advanced Instruments Model 3300 Micro Osmometer determines the osmolality of solutions using freezing point depression (FPD). It is ideal for serum, urine or other bodily fluids in clinical applications; and medi...

    $2,500 USD
    Murrieta, CA
  • Semilab CMS3 non contact sheet

    Semilab CMS3 non contact sheet resistance measuring system

    • Manufacturer: Semilab

    CMS, CLS FAST NON-CONTACT MATERIAL CHARACTERIZATION AND PROCESS CONTROL Emitter sheet resistance is a primary quality control parameter for silicon wafers in PV applications after emitter diffusion. The CLS mo...

    $17,500 USD
    San Jose, CA
  • KLA-Tencor Alpha Step 500 Profilometer

    KLA-Tencor Alpha Step 500 Profilometer

    • Manufacturer: KLA-Tencor
    • Model: Alpha-Step 500

    Features: Computer controlled Scanning and data collection Comprehensive data analysis software Intuitive user interface Application-specific recipes easily programmed Stylus-based surface profiler adjustable bet...

    San Jose, CA
  • KLA-Tencor 5100XP Overlay Measurement System

    KLA-Tencor 5100XP Overlay Measurement System

    • Manufacturer: KLA-Tencor
    • Model: 5100XP

    The KLA-Tencor 5100 XP system is a metrology tool which performs Overlay (misregistration), CD (optional), and Height measurements(optional) automatically on thin film semiconductor wafers. Measurements are made ...

    San Jose, CA
  • Trusted Seller
    Hitachi S 3000 N Scanning

    Hitachi S 3000 N Scanning Electron Microscope (SEM)

    • Manufacturer: Hitachi
    • Model: S-3000N

    - Variable Pressure (Low Vacuum) - 6" Stage - Windows XP Operating System - HP DC 7600 - Software Options: - Measurement - PCI Interface (Image management) - H.R. Image Memory - SEM Data Management - Ful...

    United States
  • DataPhysics ACA50 Dynamic Contact Angle

    DataPhysics ACA50 Dynamic Contact Angle with programmable stage

      Fully automatic and programmable video based measurement of static and dynamic contact angle according to the Sessile and Captive Drop Method. Multiple dosing unit holds maximum of 6 ES-A electric dosing modules...

      $19,500 USD
      San Jose, CA
    • Trusted Seller
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      SEM Defect Review DR

      • Manufacturer: Unknown

      • Currently configured for 300mm (12in) wafer sizes • MFG Date: 2007 • Install Type: Stand-Alone • Factory Interface (FI): o FI version: 5.3+ o (2) 300mm TDK TAS300 FOUP load-ports ? 25-slot FOUP support o Wafer ...

      Bree, Ireland
    • Trusted Seller
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      SEM Critical Dimension CD Measurement

      • Manufacturer: Unknown

      • Currently configured for 300mm (12”) wafer sizes • MFG Date: 2006 • CE Marked • Install Type: Stand-Alone • Cassette Interface (FI): o (3) 300mm TDK TAS300-F1 FOUP load-ports o Wafer Handling Robot (Track): Bro...

      Bree, Ireland
    • Trusted Seller
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      APPLIED MATERIALS SEMVISION G4

      • Manufacturer: Amat
      • Model: Semvision

      APPLIED MATERIALS SEMVISION G4 EQUIPMENT DETAILS: • Currently configured for 300mm (12in) wafer sizes • MFG Date: 2007 • Install Type: Stand-Alone • Factory Interface (FI): o (2) 300mm TDK TAS300 FOUP load-ports ...

      Bree, Ireland
    • Trusted Seller
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      PartsOptions

      • Manufacturer: Unknown

      • Main Unit: o 300mm Front-End Only o Currently configured for 300mm Wafer Sizes o MFG Date: Nov 2006 o CE Marked o Model: Phoenix D1.3 o Schematic DWG: 0087865-000 • Cassette Interface: o (2) 300mm Asyst IsoPort...

      Bree, Ireland
    • Trusted Seller
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      FE SEM

      • Manufacturer: Unknown

      Tool status: Currently located in a lab powered up but due to be powered down and moved in mid March 2015. Includes the following: – One (1) PN# 595-9123 S-5200 FE-SEM Standard Specimen Holder (595-9742), Assorte...

      Bree, Ireland
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    Overview

    Semiconductor metrology involves the measurement and analysis of semiconductor wafers and devices. This category includes tools and equipment used to ensure the precision and accuracy of semiconductor manufacturing processes. These instruments are vital for quality control, helping to detect defects and ensure that devices meet strict industry standards.

    FAQ

    What factors should I consider when buying semiconductor metrology equipment?

    Consider the equipment's measurement accuracy, resolution, and compatibility with your specific semiconductor processes. Evaluate the vendor's support services and the equipment's ease of integration into your existing systems.

    How can I ensure safe shipping of semiconductor metrology equipment?

    Use a specialized shipping service experienced in handling sensitive and high-precision equipment. Ensure the equipment is well-packaged with proper cushioning and handling instructions.

    What is the maintenance schedule for semiconductor metrology equipment?

    Regular calibration and inspection are essential. Follow the manufacturer's guidelines for preventative maintenance, including cleaning optical components and checking for software updates. Maintain a log of all maintenance activities.