TSK UF3000
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF3000
TSK UF3000 was developed to be the de facto standard model for the semiconductor testing process that accurately meets these needs. It is a fully automatic, ultra-high function probing machine that meets the tota...
Sherwood, OR
STI iFocus Wafer Inspection Machine
- Manufacturer: STI
iFocus STI’s iFocus is a highly intelligent precision wafer inspection system that offers a comprehensive solution for the inspection of frame and/or whole wafer. Using STI’s proprietary On-The-Fly (OTF™) vision,...
Singapore- Trusted Seller
KLA-Tencor Surfscan SP1 DLS
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
KLA-Tencor Surfscan SP1 DLS The Surfscan SP1 DLS unpatterned wafer inspection system captures yield-limiting defects down to 50nm at high throughput, to accelerate yield learning rates across all process modules ...
Bree, Ireland 
STI tSort Wafer Level Die Sorter
- Manufacturer: STI
tSort intelligent, intuitive and high speed die sorting tSort is a cost effective solution developed for high speed die sorting into tape and reel. Process knowledge from our widely acclaimed range of taping mach...
Singapore- Trusted SellerTrim, Ireland
- Trusted Seller
TEL P-12XLM
- Manufacturer: Tokyo Electron - TEL
- Model: P-12XLM
TEL P-12XLM Wafer size: 300MM Process: ATE
Trim, Ireland - Trusted Seller
MICROMANIPULATOR PROBE STATION 1
- Manufacturer: Micromanipulator
MICROMANIPULATOR PROBE STATION 1 Wafer size: 200mm Process: ATE
Trim, Ireland 
2010 Automated Measurement System EVG40NT
- Manufacturer: EVG GROUP
The EVG40 NT (stand-alone tool) and the AVM (HVM-integrated module) enable measurement of lithography-relevant parameters like critical dimensions, as well as bond alignment accuracy. Because of the system’s high...
Wu Xi Shi, China- Trusted Seller
1991 TSK A-PM-88A
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: A-PM-88A
Category: ETC Maker: TSK Model: A-PM-88A Wafer Size: 200 Process: Prober
Asia - Trusted Seller
1985 KLA SURFSCAN 6220
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
Wafer Size 200 mm Fab Section Metrology Tool Status Running Wafers Asset Description PCT0009(SMP-CTECH) Software Version WIN95 CIM GEM Process DO MEASUREMENT Options System NA OK Others LPT 1 OK Main Sys...
Asia - Trusted Seller
Pilot V8 HR flying needle online measurement vertical double-sided 8-pin
Guckless technology for challenging probe cards Wafer fabrication is a step-by-step process that gradually forms electronic circuits. By way of simplification, during the fabrication of a silicon wafer, some inte...
Shenzhen, China 
193 Blue Film AOI
Blue Film AOI Blue Film AOI is a kind of automatic optical inspection equipment for detecting defects on the surface of semiconductor wafers. It can be used in conjunction with optical positioning devices and cha...
Zhubei City, Hsinchu County, Taiwan 302- Trusted Seller
Agilent (HP) 4156C Semiconductor Parameter Analyzer
- Manufacturer: Agilent - Keysight
- Model: 4156C
The Keysight / Agilent 4156C Precision Semiconductor Parameter Analyzer provides highly accurate laboratory benchtop parameter analyzers for advanced device characterization. The superior low-current and low-volt...
Shenzhen, China - Trusted SellerAsia
- Trusted Seller
ADVANTEST M6751AD
- Manufacturer: Advantest
- Model: M6751AD
ADVANTEST M6751AD Wafer size: 200mm Process: ATE
Asia
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