Used Test & Measurement (Semiconductors) in Malaysia

Die-Level Test

Input options: Waffle Pack, Wafer Ring, De-Taper | Output options: Waffle Tray, Wafer Reconstruction, Tape & Reel | Package type: Die | Test capabilities: AC Test, DC Test, UIS Test at ambient to hot temperature

Module-Level Final Test

Input/ output options: Metal Tray, Blister Tray, Plastic Tube Stacker | Selection of packages: Plastic Case Power Modules, Double-side cooling power module (DSC) | Ambient/hot temperature test: Ambient Temperatu...

Gravity Feed Test & Vision

Gravity Feed Test & Vision Handler A well-established gravity platform for discrete & ICs elevated temperature testing with smart temperature controls, user definable soak time and auto calculation of offset temp...

DBC/AMB Substrate-Level Test

Input/ output option: Slot Magazine | Package type: DBC Substrate, AMB Substrate | Ambient/hot temperature test: Ranging from 25°C to 175°C | Temperature control & features: (25°C to 175°C) | Soak time: >90s bas...

Final Inspection

Power Module Final Inspection HandlerIt offers advanced final inspection solutions for 2D Pin position, 3D pin height inspection and cosmetic inspection for power modules before packing them into trays or plastic...

Pin Insertion

Pin Insertion HandlerIt is capable of processing any manufacturers reeled thru-hole or press-fit products with real time insertion force monitoring and caters to multiple types of pins depending on requirements.

Strip to Strip Vision Inspection

Package type: Strip | Input/ output option: Slot Magazine

Turret Base Vision Inspection

Turret Base Vision Inspection Handler A high-speed turret platform that offers one stop vision inspection solutions for both leaded and leadless packages with a wide range of input and output configurations.

Module-Level Burn-in

Input/ output options: JEDEC Tray | Selection of packages: Silicon Carbide (SiC), Gallium Nitride (GaN) Power devices | Channel number: Up to 720 power device burn-in test parallelism | Burn-in duration: Program...

Reel to Reel Vision Inspection

Reel to Reel Vision Inspection Handler The solution for reel to reel post seal vision inspection which comes in 8, 12, 16 and 24 width tracks to accommodate customer’s unit tape in different widths.

Paper Tape to Tape Vision Inspection

Paper Tape to Tape Vision Inspection Handler An innovative, advanced and compact tape to tape platform vision handler that inspects the lead, mark and cosmetics of TO devices in paper tape form.

Nordson DAGE 4000 Test & Measurement (semiconductors)

• Manufacturer: Nordson DAGE
• Model: 4000

Good condition Nordson DAGE 4000 Test & Measurement (semiconductors)s available between 2003 and 2012 years. Located in Ireland and other countries. Click request price for more information.