Building Filters
Ultrasonic scanning microscope Laes410
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, ChinaUltrasonic Scanning Microscope Laes400
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, ChinaUltrasonic Scanning Microscope T100
1. Introduction: 1. Ultrasonic scanning microscope detection technology has the characteristics of fast detection speed and no damage to workpieces. It is widely used in medical, petroleum, automobile, semiconduc...
Shanghai, ChinaUltrasonic scanning microscope Laes1200
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, ChinaUltrasonic Scanning Microscope Laes1000
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, ChinaUltrasonic scanning microscope Laes810
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, ChinaUltrasonic Scanning Microscope Laes600
1. Introduction: 1. Ultrasonic scanning microscope detection technology has the characteristics of fast detection speed and no damage to workpieces. It is widely used in medical, petroleum, automobile, semiconduc...
Shanghai, ChinaUltrasonic scanning microscope Laes430
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, ChinaUltrasonic Scanning Microscope T500
1. Field of application 1. Layer detection of semiconductor chip packaging 2. Software functions and features 1. Software function 2. Software features: 3. Technical parameters Six, the main configuration table F...
Shanghai, ChinaUltrasonic scanning microscope Laes620
1. Introduction: 1. As China's semiconductor materials industry begins to promote the "Nanniwan Spirit" of domestic manufacturing and self-reliance, it is developing in the direction of refinement, high-end, cutt...
Shanghai, ChinaUltrasonic scanning microscope Laes630
1. Introduction: 1. As China's semiconductor materials industry begins to promote the "Nanniwan Spirit" of domestic manufacturing and self-reliance, it is developing in the direction of refinement, high-end, cutt...
Shanghai, ChinaUltrasonic Scanning Microscope T300
1. Introduction: 1. Ultrasonic scanning microscope detection technology has the characteristics of fast detection speed and no damage to workpieces. It is widely used in medical, petroleum, automobile, semiconduc...
Shanghai, ChinaUltrasonic Scanning Microscope Laes1100
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, ChinaUltrasonic scanning microscope Laes830
1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...
Shanghai, ChinaUltrasonic Scanning Microscope Laes800
1. Introduction: 1. Ultrasonic scanning microscope detection technology has the characteristics of fast detection speed and no damage to workpieces. It is widely used in medical, petroleum, automobile, semiconduc...
Shanghai, China