Used Rudolph Semiconductors

Rudolph NSX-115 Advanced Wafer Inspection

• Manufacturer: Rudolph
• Model: NSX-115

Rudolph NSX-115 Advanced Wafer Inspection consisting of: - Model: NSX-115- Ultra port quick change top plate & film frame quick change top plate- Ultra port 50/50: - Loadport A is for film frame for 6&8” filmfr...

Rudolph / August NSX-95 Automated Defect Inspection

• Manufacturer: Rudolph
• Model: NSX-95

Rudolph / August NSX-95 Automated Defect Inspection consisting of: - Model: NSX-95- NSX Automated Wafer Handling System- WHS (Wafer Handler System) top plate- 4”/6”/8” Wafer Handler- Xandex 350-0002 Pneumatic Die...

Rudolph / August NSX-105 Automated Wafer, Die & Bump Inspection

• Manufacturer: Rudolph
• Model: NSX-105

Rudolph / August NSX-105 Automated Wafer, Die & Bump Inspection consisting of: - Model: NSX-105- Automated Wafer, Die & Bump Inspection- 4”/6”/8” Wafer Handler- Ultraport top plate- Objectives: 1, 2, 5, 20x - PC...

Rudolph Auto EL Elipsometer

• Manufacturer: Rudolph
• Model: Auto EL

Rudolph Auto EL Elipsometer Wafer size: 150mm

1995 Rudolph FE-IIID

• Manufacturer: Rudolph

Rudolph FE-IIID Dual Wavelength Focus Ellipsometer Measurement Console The Measurement Console contains the following components: • Measurement system (including vacuum control, stage, lifters, optical components...

1992 Rudolph FE III

• Manufacturer: Rudolph
• Model: FE-III

Rudolph Metapulse II 200-X

• Manufacturer: Rudolph
• Model: Metapulse 200

Rudolph MetaPULSE II 200 X Thickness Measurement System, s/n 200MP11-1608-AW-11. The MetaPULSE X Cu supports all aluminum interconnect processes and the silicides, ultra-thin barriers, and tungsten processes in a...

Rudolph Autopol V

• Manufacturer: Rudolph

Rudolph Research Autopol V Polarimeter Rudolph Autopol V six wavelength polarimeter 365, 405, 436, 546, 633nm TempTrol electronic heating and cooling from 15-30C A700T TempTrol NIST traceable quartz standard w...

Rudolph / August NSX 105

• Manufacturer: Rudolph
• Model: NSX-105

Wafer Inspection System

1997 RUDOLPH FE-VII-SD

• Manufacturer: Rudolph

The dual wavelength FE VII-SD is a production metrology tool built around a FOCUS ellipsometer. Rudolph Technologiesl wavelength FE VII-SD is a production metrology tool built around a FOCUS ellipsometer. This ...

Rudolph / August NSX 95

• Manufacturer: Rudolph
• Model: NSX-95

Automated Defect Inspection

Rudolph COMPUTER DUAL PROCESSOR KONTRON

• Manufacturer: Rudolph

As is, where is

RUDOLPH FE-VII-D, Focus Ellipsometer

• Manufacturer: Rudolph

RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...

2007 RUDOLPH AXi 935 D Advanced Wafer Inspection, 12"

• Manufacturer: Rudolph
• Model: AXI 935

2007 Vintage