Rudolph Research FE-IIID Focus Dual Wavelength Ellipsometer
- Manufacturer: Rudolph
The FE III-D's advanced Focused Beam™ system uses dual wavelength technology to directly measure the sample with a small spot at multiple angles of incidence and at multiple wavelengths. This allows the system to...
San Jose, CA- Trusted Seller
Rudolph NSX-115 Advanced Wafer Inspection
- Manufacturer: Rudolph
- Model: NSX-115
Rudolph NSX-115 Advanced Wafer Inspection consisting of: - Model: NSX-115- Ultra port quick change top plate & film frame quick change top plate- Ultra port 50/50: - Loadport A is for film frame for 6&8” filmfr...
Decatur, GA
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