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Used Rudolph Metrology / Inspection (Semiconductors) in Texas, USA

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    Rudolph Metapulse II 200-X

    Rudolph Metapulse II 200-X

    • Manufacturer: Rudolph
    • Model: Metapulse 200

    Rudolph MetaPULSE II 200 X Thickness Measurement System, s/n 200MP11-1608-AW-11. The MetaPULSE X Cu supports all aluminum interconnect processes and the silicides, ultra-thin barriers, and tungsten processes in a...

    Grapevine, TX
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    Rudolph Metapulse 200 Metrology / Inspection (semiconductors)

    • Manufacturer: Rudolph
    • Model: Metapulse 200

    Good condition Rudolph Metapulse 200 Metrology / Inspection (semiconductors)s available between 2003 and 2005 years. Located in South Korea and other countries. Click request price for more information.

    South Korea