Building Filters
2006 N&K N&K 5000-CD
- Manufacturer: N&K
To be fully refurbished. Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
2012 KLA TENCOR P16+
- Manufacturer: KLA-Tencor
- Model: P16
The KLA-Tencor P-16+ Profiler is a highly sensitive surface profiler that measures step height, roughness, and waviness on sample surfaces. •; Up to 8" wafer size •; Microhead 5 - sr •; Dual view optic (Top & sid...
Cheonan-si, South Korea
2010 SDI/SEMILAB MCV2500
- Manufacturer: Semilab
■ Capable up to 12" Wafer ■ SSM 52 Capacitance Measurement Unit ■ Motor control unit ■ Pneumatic control Unit ■ PC System ■ PROCAP software ■ Performance ■ Drive Signal Frequency at 1Mhz voltage=15mV rms ■ CDA: 8...
Cheonan-si, South Korea
SDI/SEMILAB FAaST 200 SL
- Manufacturer: Semilab
- Model: FAAST 200 SL
non-contact electrical C-V & I-V measurement system capable of measuring on product wafers. Measurements can be made in scribe line test sites or in the active cell area. Cell measurements allow for the first ti...
Cheonan-si, South Korea
2005 KLA TENCOR OSA6100
- Manufacturer: KLA-Tencor
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Disk substrates
Cheonan-si, South Korea
2006 KLA TENCOR OSA6100
- Manufacturer: KLA-Tencor
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Disk substrates
Cheonan-si, South Korea
Cheonan-si, South Korea
2009 KLA TENCOR CS10V
- Manufacturer: KLA-Tencor
- Model: CS10V
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (S...
Cheonan-si, South Korea
2006 KLA TENCOR CS20
- Manufacturer: KLA-Tencor
- Model: CS20
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (S...
Cheonan-si, South Korea
2005 N&K 1700RT
- Manufacturer: N&K
Broadband spectrometry for film thickness and trench profile measurements on photomask reticles. The n&k 1700-RT is designed for handling 5” or 6” square masks. The n&k 1700-RT simultaneously determines thickness...
Cheonan-si, South Korea
2006 N&K N&K 5700 CDRT
- Manufacturer: N&K
Broadband spectrometry for film thickness and trench profile measurements on photomask reticles. The n&k 5700-CDRT automated system is designed for handling 5” or 6” square masks. The n&k 5700-CDRT simultaneously...
Cheonan-si, South Korea
1997 LEO/KOBELCO LTA-700
- Manufacturer: Kobelco
Variiable Injection Type Wafer Lifetime Measuring System.
Cheonan-si, South Korea
HITACHI S-5500
- Manufacturer: Hitachi
- Model: S-5500
In-lens Field Emission Scanning Electron Microscope. Imgae Resolution : - 0.4nm guaranteed at accelerating voltage 30kV - 1.6nm guaranteed at accelerating voltage 1kV Magnification : - LM Mode 60X~100,0000X - H...
Cheonan-si, South Korea
N&K N&K 1700
- Manufacturer: N&K
*. Film Thickness and Trench profile measurement. *. Manual load Metrology system. *. Simultaneously determine thickness, n and k in the spectral range of 190-1000nm, trench profile and provide non-destructive, r...
Cheonan-si, South Korea
1997 SOLID STATE MEASRUEMENT INC. SSM5200
- Manufacturer: SOLID STATE MEASRUEMENT INC.
Fully automated capacitance-voltage(CV),charge-voltage(QV), and current-voltage(IV) system [Direct Measurement] - Accurately measure CV, QV and IV characteristics of MOS test structures in scribe lines on product...
Cheonan-si, South Korea