Used electronics

Hitachi S-800 Scanning Electron Microscope

• Manufacturer: Hitachi

Hitachi S-800 Scanning Electron Microscope, Anelva 956-7152, Daia DPF-4Z Parts

JEOL JWS-7555 scanning electron microscope

• Manufacturer: Jeol

JEOL JWS 7555 is a scanning electron microscope (SEM) that utilizes an advanced electron optical equipment, providing a high level of image performance. It is suitable for a wide range of applications, including ...

HITACHI S-3400N Scanning Electron Microscope

• Manufacturer: Hitachi
• Model: S 3400N

The Hitachi S-3400N Variable Pressure SEM has been developed by improving the design of the S-3000N VP SEM which has been well accepted in the world market. It allows the study of wet, oily and/or non-conductive ...

2002 Hitachi S 5200 Scanning Electron Microscope

• Manufacturer: Hitachi
• Model: S-5200

SEM - Cold FE-Tip, Two SE Detectors - TMP Pumping System - Windows Control System - Oxford EDS System 2002 Vintage

Hitachi Wafer Prealigner S-9300 CD Scanning Electron Microscope System Working

• Manufacturer: Hitachi

“Removed from a Hitachi S-9300 CD Scanning Electron Microscope System” Hitachi Wafer Prealigner S-9300 CD Scanning Electron Microscope System Working Removed from a Hitachi S-9300 CD Scanning Electron Microscope ...

Hitachi S 4500 Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-4500

HITACHI TM-3030Plus Desktop Scanning Electron Microscope

• Manufacturer: Hitachi
• Model: TM3030 PLUS

The Hitachi TM-3030Plus Desktop Scanning Electron Microscope is a unit type microscope manufactured in Japan. It is designed for high-resolution imaging and analysis in various fields such as research, education,...

2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope

• Manufacturer: Jeol

Jeol 2100 Probe-Corrected Analytical Electron Microscope - Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with EDS, EELS/EFTEM for elemental mapping and thickness measur...

2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope

• Manufacturer: Jeol

- Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with EDS, EELS/EFTEM for elemental mapping and thickness measurements - Acceleration Voltage: 100 and 200 kV - Filament...

Hitachi S 3000 N Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-3000N

- Variable Pressure (Low Vacuum) - 6" Stage - Windows XP Operating System - HP DC 7600 - Software Options: - Measurement - PCI Interface (Image management) - H.R. Image Memory - SEM Data Management - Ful...

1997 Hitachi S-4500 II Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-4500

- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guaranteed (at accelerating voltage 1 kV, working distance 3mm) Magnification: ...

1997 Hitachi S-4500 II Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-4500

- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guaranteed (at accelerating voltage 1 kV, working distance 3mm) Magnification: ...

1998 Hitachi S 5000 Field Emission Scanning Electron Microscope

• Manufacturer: Hitachi
• Model: S-5000

- Ultra High Resolution - Accelerating Voltage: 30 kV - Magnification: 500,000x Performance - Image Resolution: 0.6 nm (at 30 kV),3.5 nm (at 1 kV) in secondary electron image Magnification - Low mag mode: x...

2018 Jeol JSM-IT200LV InTouchScope Scanning Electron Microscope

• Manufacturer: Jeol
• Model: JSM

Jeol JSM-IT200LV InTouchScope Scanning Electron Microscope IXRF EDS detector included DOM: 2018 High resolution imaging in HV/LV/SE/BSE Zeromag-mode for intuitive transition from light-optic to SEM image Che...