Semiconductors » Metrology / Inspection (semiconductors) » CD-SEM (Critical Dimension SEM) » Meath

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Used Cd Sem (Critical Dimension Sem) in Meath, Ireland

  • Trusted Seller
    Hitachi S-7840

    Hitachi S-7840

    • Manufacturer: Hitachi
    • Model: S-7840

    Process Type: Metrology & Inspection Date of Manufacture: 2001 Refurbished Hitachi S-7840 configured for 6 or 8 inch (smaller wafer sizes possible) SW Version: 11 Options list: SECS Multipoint Measurement ...

    Trim, Ireland
  • Trusted Seller
    Hitachi CG4000

    Hitachi CG4000

    • Manufacturer: Hitachi
    • Model: CG4000

    Status of Equipment: Installed Configuration: 553-9015 CG4000 3PORT 569-6874 Dry pumps I/F unit "F" 15m 554-0745 Loadport 553-9223 New Edge Roughness Measurement 553-9224 Defect Review I/F (All) 553-9225 Fl...

    Trim, Ireland
  • Trusted Seller
    HITACHI S-7000 CD SEM

    HITACHI S-7000 CD SEM

    • Manufacturer: Hitachi
    • Model: S-7000

    CD SEM Measurement Tool - Wafer Size Range Minimum 100 mm Maximum 150 mm Set Size 150 mm - Resolution 150.00 Å - Acceleration Voltage Maximum Voltage 3 kV - Critical Dimension Measurement Range 0.10 µm - 200.0...

    Trim, Ireland
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    Hitachi S6100 SEM

    • Manufacturer: Hitachi
    • Model: S-6100

    Trim, Ireland
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    CAMERA ASSEMBLY (SONY)

    • Manufacturer: Hitachi
    • Model: S-8820

    Trim, Ireland
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    TURBOTRONIK NT10

    • Manufacturer: Hitachi
    • Model: S-8820

    Trim, Ireland
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    HARD DRIVE UNIT

    • Manufacturer: Hitachi
    • Model: S-8820

    Trim, Ireland
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    LOAD LOCK TURBO PUMP

    • Manufacturer: Hitachi
    • Model: S-8820

    Trim, Ireland
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    STACK TURBO PUMP

    • Manufacturer: Hitachi
    • Model: S-8820

    Trim, Ireland
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    ETCH PROCESS PUMP

    • Manufacturer: Hitachi
    • Model: S-8820

    Trim, Ireland
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    TURBOTRONIK NT 340 M

    • Manufacturer: Hitachi
    • Model: S-8820

    Trim, Ireland

Overview

CD-SEM (Critical Dimension Scanning Electron Microscopy) is a high‑precision inspection tool used in semiconductor metrology to measure linewidths, spaces and feature profiles on wafers and masks. It combines electron imaging with advanced software to deliver nanometer‑scale CD measurements, overlay checks and defect characterization. CD‑SEMs are common in fabs and R&D and require controlled environments, regular calibration and specialized service for repeatable, traceable results.

FAQ

What should I check when buying a used CD‑SEM?

Review service and vacuum logs, column condition, detector history, software licenses and versions, calibration certificates, availability of spare parts and any completed upgrades or refurbishments.

What site requirements are needed before installation?

Ensure appropriate cleanroom class, vibration isolation, stable power and grounding, chilled water or HVAC, compressed air/gas hookups, adequate floor loading and operator space.

How should a CD‑SEM be shipped to avoid damage?

Use specialized freight with column locking, climate control, shock sensors, secure crating and an experienced equipment transporter; plan for on‑site unpacking and qualification.

What routine maintenance does a CD‑SEM require?

Regular checks include vacuum pump service, electron source replacement or conditioning, detector cleaning, stage calibration, software updates and preventive maintenance by trained technicians.

Are calibrations and traceability usually included with a purchase?

Not always; ask for recent calibration certificates or arrange manufacturer or accredited‑lab calibration and establish a periodic verification schedule for traceability.