- Trusted Seller
Ultracision Polar III T7
used
- Manufacturer: Polar
Ultracision Polar III T/7 Ultracision Polar III T/7 CV Mercury Probe
Bree, Ireland 
KLA-Tencor Surfscan 7700 Wafer Inspection System
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 7700
A patterned and unpatterned wafer inspection and can accommodate wafers between 4" to 8". Features: High sensitivity on after-ech and high topography applications Dual collection channels Circular input polarizat...
San Jose, CA- Trusted Seller
Nordson Yestech FX-940 3D AOI System
used
- Manufacturer: Nordson
- Model: FX-940
Nordson Yestech FX-940 3D AOI System Automated Optical Inspection System DOM: 12/2015 3D Inspection Proprietary megapixel color imaging Capture on the fly technology 1 top-down and 4 side angle cameras Qui...
Arizona, USA - Trusted Seller
Tencor Surfscan 7700M
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 7700
Tencor Surfscan 7700M (Surfscan 7700) Patterned Wafer Inspection System. Can detect defects as small as 0.15 ¿m, while defects below 0.2 ¿m can be detected on many process levels, inc...
Rocklin, CA 
Nikon Optiphot 150 Inspection Microscope for brightfield, darkfield, and DIC
used
- Manufacturer: Nikon
- Model: Optiphot 150
Reflected light microscope configured for brightfield, darkfield, and DIC ( Nomarkski) inspection stage has 6x6 xy travel 5 place universal nosepiece CF BD Plan DIC 5x/10x/20x/50x objectives 4 Nomarski prisms...
Nikon Optiphot-POL
used
- Manufacturer: Nikon
- Model: Optiphot
Includes: Nikon Optiphot POL Polarizing Trinocular Microscope Leitz Wetzlar Pl Fl 4/0.14 Nikon 231611 Plan 40 DIC 0.65 160/0.17 2x CFW10X Eyepieces Power Cord This item is fully tested and in excellent working or...
$1,745 USDRancho Cordova, CA
Zeiss LM100 Inspection Microscope for wafers up to 450mm or flat panels up to 548mmx548mm with motorized stage, brightfield, darkfield, and Nomarski inspection
used
- Manufacturer: Zeiss
- Model: LM100
Zeiss inspection microscope for large wafers and panels with reflected and transmitted light Brightfield, darkfield, Nomarski (DIC) inspection Merzhauser motorized xy stage with 550mm x 550mm travel (21.6"x21.6...
- Trusted Seller
Nordson Yestech YTV-FX
used
- Manufacturer: Nordson
For more information regarding stock and pricing, please click here. Nordson YESTECH YTV-FX in excellent condition. vintage 2011 Specifications: Defects Detected: Part: position, missing, wrong, polarity, skew, t...
Veenendaal, Netherlands - Trusted Seller
CDE ResMap 273 Resistivity Mapping System
used
- Manufacturer: CDE
- Model: Resmap
CDE ResMap 273 Resistivity Mapping System consisting of:- Manufacturer: Creative Design Engineering - Model: ResMap 273 - PC w/ windows XP- Maximum Throughput: 1 minute per wafer- Measurement Range: 2 mΩ/- 5 MΩ/...
Decatur, GA - Trusted Seller
Tektronix 576
used
- Manufacturer: Tektronix
- Model: 576
Curve Tracer The Tektronix 576 Curve Tracer is a rugged high power measurement system for tests on 2- and 3-terminal discrete semiconductors. With a collector supply of up to 220 W peak, adjustable current limiti...
Cary, NC - Trusted Seller
Rudolph Research AutoEL Ellipsometer
used
- Manufacturer: Rudolph Research Analytical
Rudolph Research AutoEL Ellipsometer - Operating wavelength: 632.8nm - Max sample size: 6" x 6" - Resolution & accuracy: - Polarizer or analyzer: 0.05° - Delta: 0.1° - PSI: 0.05° - Measuring time: - Single film:...
Trim, Ireland - Trusted Seller
Reichert-Jung Polyvar MET Microscope
used
- Manufacturer: Reichert Jung
Reichert-Jung Polyvar MET Microscope Reichert-Jung Polyvar MET microscope operates with bright field (BF), dark field (DF), and polarization modules. System includes eyepiece (WPK 10x), objective (Plan 5x, Pla...
Trim, Ireland - Trusted Seller
Zeiss AXIOMAT NAC Microscope
used
- Manufacturer: Zeiss
- Model: AXIOMAT NAC
Zeiss AXIOMAT NAC Microscope Zeiss AXIOMAT NAC microscope operates in reflected light with bright field (BF), Nomarski DIC, and polarization modules. System includes: - Stage module A(R) with 5 dovetail slide...
Trim, Ireland - Trusted Seller
Tencor Surfscan 7700
used
- Manufacturer: KLA-Tencor
- Model: Surfscan 7700
Tencor Surfscan 7700 (Surfscan 7700) Tencor Surfscan 7700 Pattern Wafer InpectionSystem* Substrate sizes: 100mm, 125mm, 150mm & 200mm* Patterned Wafer Inspection System. * Can detect defects as small as 0.1...
Rocklin, CA - Trusted Seller
AOI Systems Scanner based First Article Inspector
new
First Article Inspection -The FA-Inspector is a scanner-based optical inspection system used to automate first article inspections and subsequent production inspection tasks without programming. The FA-Inspector ...
Veenendaal, Netherlands
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