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Used Test & Measurement (Semiconductors) in Japan

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    2000 AGILENT 4155B&41501B

    • used

    • Manufacturer: Agilent - Keysight
    • Model: 4155B

    Manufacturing process: assembly

    Tokyo, Japan
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    2004 TSK SCU-500S

    • used

    • Manufacturer: Accretech - Tokyo Seimitsu - TSK
    • Model: SCU-500S

    Manufacturing process: ATE

    Tokyo, Japan
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    2004 TSK SCU-500S

    • used

    • Manufacturer: Accretech - Tokyo Seimitsu - TSK
    • Model: SCU-500S

    Manufacturing process: ATE

    Tokyo, Japan
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    2018 COHU JAGUAR

    • used

    • Manufacturer: Cohu

    Manufacturing process: ATE

    Tokyo, Japan
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    MJC 705A-WG2

    • used

    • Manufacturer: MJC

    Manufacturing process: ATE | Inch: 6

    Tokyo, Japan
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    2018 COHU JAGUAR

    • used

    • Manufacturer: Cohu

    Manufacturing process: ATE

    Tokyo, Japan
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    MJC MP-10

    • used

    • Manufacturer: MJC

    Manufacturing process: ATE | Inch: 8

    Tokyo, Japan
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    OMNIPHYSICS SE-6003A

    • used

    • Manufacturer: OMNIPHYSICS

    Manufacturing process: ATE | Inch: 8

    Tokyo, Japan
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    2018 SHIBASOKU WL15V

    • used

    • Manufacturer: SHIBASOKU

    Manufacturing process: ATE

    Tokyo, Japan
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    2001 DNS VM2030

    • used

    • Manufacturer: Dainippon Screen

    Manufacturing process: examination | Inch: 4,6,8

    Tokyo, Japan
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    1995 VARIAN E-220

    • used

    • Manufacturer: Varian

    Inch: 6

    Tokyo, Japan
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    2012 SEIKO EPSON NS8080W

    • used

    • Manufacturer: Epson

    Manufacturing process: ATE

    Tokyo, Japan
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    SHIBASOKU WL25

    • used

    • Manufacturer: SHIBASOKU

    Manufacturing process: ATE

    Tokyo, Japan
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    2003 KRUSS DSA100

    • used

    • Manufacturer: KRUSS

    Manufacturing process: examination | Inch: ～12

    Tokyo, Japan
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    2001 DNS VM2030

    • used

    • Manufacturer: Dainippon Screen

    Manufacturing process: examination | Inch: 4,6,8

    Tokyo, Japan
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    Teradyne J750 Test & Measurement (semiconductors)

    • used

    • Manufacturer: Teradyne
    • Model: J750

    Good condition Teradyne J750 Test & Measurement (semiconductors)s available between 2001 and 2004 years. Located in Ireland and other countries. Click request price for more information.

    Ireland
23456