Used Test & Measurement (Semiconductors) in California, USA

Nikon NWL860-TMB-SP wafer loader with Eclipse L200 microscope for 150/200mm wafers with macro and backside inspection
- Manufacturer: Nikon
- Model: NWL860
Nikon Eclipse L200 microscope with 5/10/20/50 LU Plan BD objectives for brightfield and darkfield Nikon NWL-860-TMB wafer loader with macro and backside inspection modes Nikon 8x8 shuttle stage Alignment plate...
$41,900 USD
San Jose, CA
Rudolph Auto EL 2345A
- Manufacturer: Rudolph
- Model: Auto EL
Ellipsometer, 1979 vintage.
San Jose, CA
KLA-Tencor Surfscan 7700 Wafer Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 7700
A patterned and unpatterned wafer inspection and can accommodate wafers between 4" to 8". Features: High sensitivity on after-ech and high topography applications Dual collection channels Circular input polarizat...
San Jose, CA
KLA-Tencor SFS 5000
- Manufacturer: KLA-Tencor
- Model: Surfscan 5000
Surfscan Specifications: 4", 6" and 8" compatible
San Jose, CA
KLA-Tencor Surfscan 6420 Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6420
KLA-Tencor Surfscan 6420 Inspection System, a surface inspection tool for unpatterned wafers. It accommodates wafer sizes: 100, 125, 150, and 200mm (round or rectangular substrates). The 6420 is a film surface an...
San Jose, CA
KLA-Tencor AIT I (8020)
- Manufacturer: KLA-Tencor
- Model: AIT I
A double darkfield patterned wafer inspection tool. Features: Automated wafer inspection system Double-dark field (DDF) laser scanning technology High detection sensitivity even for difficult after-etch, develop,...
San Jose, CA
Rudolph Research Auto EL IV Ellipsometer
- Manufacturer: Rudolph
- Model: Auto EL-IV
The AutoEl IV has automatic 3 wavelength operation and a scanning stage. Multiple wavelength operation gives this instrument more flexibility for meauring multiple film stacks. The scanning stage allows wafer uni...
San Jose, CA
KLA-Tencor 6200 Surfscan Analysis System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
Wafer surface contamination analyzer for unpatterned wafers. Features: Instantaneous mangified 3-D views of individual defects Color coded defect maps, histograms, and other graphics Surface haze detection Capabl...
San Jose, CA
Nikon NWL860T wafer loader for 150-200mm wafers
- Manufacturer: Nikon
- Model: NWL860
Nikon wafer loader for 150/200mm wafers Prealignment for wafer flat or notch Shuttle stage additional add $4500.
$12,500 USD
San Jose, CA
Nikon Optiphot 150 Inspection Microscope for brightfield, darkfield, and DIC
- Manufacturer: Nikon
- Model: Optiphot 150
Reflected light microscope configured for brightfield, darkfield, and DIC ( Nomarkski) inspection stage has 6x6 xy travel 5 place universal nosepiece CF BD Plan DIC 5x/10x/20x/50x objectives 4 Nomarski prisms...
$8,450 USD
San Jose, CA
KLA-Tencor Surfscan 7600 Particle Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 7600
A particle inspection tool - capable of up to 200mm wafers. Specifications:
San Jose, CA
KLA-Tencor 6100 Surfscan Analysis System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6100
Unpatterned wafer surface contamination analyzer Features: Instantaneous magnified 3-D views of individual defects. Color coded defect maps, histograms, and other graphics. Surface haze detection. Specifications:...
San Jose, CA
Zeiss LM100 Inspection Microscope for wafers up to 450mm or flat panels up to 548mmx548mm with motorized stage, brightfield, darkfield, and Nomarski inspection
- Manufacturer: Zeiss
- Model: LM100
Zeiss inspection microscope for large wafers and panels with reflected and transmitted light Brightfield, darkfield, Nomarski (DIC) inspection Merzhauser motorized xy stage with 550mm x 550mm travel (21.6"x21.6...
$29,500 USD
San Jose, CA
Alessi REL-4100 manual prober with LY1 1064nm laser cutting system
- Manufacturer: Alessi
- Model: REL-4100
Mitutoyo microscope 1064nm pulsed YAG laser Alessi 4100 manual prober with 150mm vacuum chuck and APO 10X objective
$11,500 USD
San Jose, CA
Nikon 200mm wafer inspection station with NWL200-TMB (2012) wafer loader and Eclipse L200 microscope
- Manufacturer: Nikon
- Model: NWL200
Nikon 200mm automated inspection system with Eclipse L200 microscope and Nikon NWL200-TMB wafer loader Topside, Macro, backside inspection modes May be configured for 150mm or 200mm wafers. Â Includes shuttle s...
$85,900 USD
San Jose, CA
KLA-Tencor Surfscan 5500 Test & Measurement (semiconductors)
- Manufacturer: KLA-Tencor
- Model: Surfscan 5500
Good condition KLA-Tencor Surfscan 5500 Test & Measurement (semiconductors)s. Located in USA and other countries. Click request price for more information.
USA