Used Test & Measurement (Semiconductors) in California, USA

KLA-Tencor 7700 Wafer Inspection System (M)

• Manufacturer: KLA-Tencor

Patterned / Unpatterned wafer inspection system. Specifications: 100mm-200mm Wafer Configurable 2 Particle Collection Channels 0.15um Particle Sensitivity Multiscan Capable Automatic Coordinate Registration Rando...

KLA-Tencor Model AIT XP Darkfield Inspection System

• Manufacturer: KLA-Tencor
• Model: AIT XP

The KLA-Tencor AIT XP+ Patterned Wafer Inspection system is designed to meet the needs of 0.13um and beyond design rule processes. Based on the highly popular AIT series, the AIT XP+ incorporates Mixed Mode Detec...

KLA-Tencor AIT I In-Line Defect Inspection System

• Manufacturer: KLA-Tencor
• Model: AIT I

Automated full water inspection system for detecting particles as small as 0.10 micrometers on bare silicon and patterned process wafers Features: High detection sensitivity even for difficult after-etch, develop...

KLA-Tencor Surfscan 5500 Surface Particle Inspection Analyzer

• Manufacturer: KLA-Tencor
• Model: Surfscan 5500

Features: Handles high scattering surfaces such as metals, polysilicon, and CVD films. Map locations size available for each particle. Specifications: Can handle from 2" to 8" wafers Submicron sensitivity, detect...

KLA-Tencor 6220 Surfscan

• Manufacturer: KLA-Tencor
• Model: Surfscan 6220

This tool detects, counts, and sizes defects Specifications: Repeatability is less than 1.0% at 1 of 0.204 diameter latex spheres on bare silicon Contamination is less than 0.005 particles/cm² greater than 0.15µm...

Rudolph Research FE-IIID Focus Dual Wavelength Ellipsometer

• Manufacturer: Rudolph

The FE III-D's advanced Focused Beam™ system uses dual wavelength technology to directly measure the sample with a small spot at multiple angles of incidence and at multiple wavelengths. This allows the system to...

ADE UltraScan 9350 Wafer Inspection / Sorter System

• Manufacturer: ADE

Non-contact capacitive probe measurement with 10nm resolution, 400 to 1000 microns wafer thickness range. Capable of handling 100mm to 200mm wafers Features: 2 cassette input stations, 3 cassette output stations,...

KLA Tencor Surfscan SP1-DLS Wafer Surface Analysis System

• Manufacturer: KLA-Tencor
• Model: Surfscan SP1

KLA Tencor Surfscan SP1-DLS Wafer Surface Analysis System set up for 200mm Edge Grip Handler. Cassette Open Handler System/SMIF/Dual Cassette. System refurbished to meet OEM Specifications. Features: Includes the...

KLA-Tencor Surfscan 6400 Film Surface Analysis System

• Manufacturer: KLA-Tencor
• Model: Surfscan 6400

KLA-Tencor 6400 Surfscan film surface analysis system for detection of contaminating particles. Detects contaminating partciles on all surfaces even rough surfaces. Small particles on dielectrics, polysilicon, ba...

Nikon Optiphot 200D Microscope with MicroMetric Microline 300

• Manufacturer: Nikon
• Model: Optiphot 200

Features: 6 turret Nomarski DIC Tilting trinocular heads, 10X eyepieces Nikon RCP-21 Remote scope Color video camera Camera adapter 8" wafer stage Keyboard and Mouse Specifications: MicroMetric MicroLine 300 Feat...

DCI HM1818 Motorized XY Stage with 18x18 XYTravel

Motorized XY stage with 18"x18" travel Sort: 0

Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage

• Manufacturer: Veeco - Sloan
• Model: Dimension

Nanoscope III SPM and controller LSS large sample scanning stage allows imaging on samples up to 8"x8" with 6"x6" XY travel. Samples up to 1.25" thick Includes 850x optical microscope and fully automated stag...

Zeiss/HSEB Axiospect 300 Automated Wafer Inspection and Review station for 200mm/300mm wafers

• Manufacturer: HSEB

Wafer inspection/review station for bare and patterned wafers Inspect 300mm wafers in FOUP loaders or 200mm wafers in open cassetes with adaptors 2 FOUP loaders Axiotron 300 microscope Equipe robot with PRE-5...

Nikon Optiphot 300 with reflected and transmitted light and 10x14 XY stage travel

• Manufacturer: Nikon
• Model: Optiphot 300

Configured for Reflected and Transmitted Light Brightfield & Darkfield observation Trinocular Viewing Head 5 place nosepiece with motorized rotation and keypad CF Plan 5x/10x/20x/50x objectives stage with gl...

Nikon DIC motorized polarizer for Optiphot 200/300 with 1/4 wave plate

• Manufacturer: Nikon
• Model: Optiphot 200

Nikon DIC motorized polarizer for Optiphot 200/300 with 1/4 wave plate

KLA-Tencor Surfscan 5500 Test & Measurement (semiconductors)

• Manufacturer: KLA-Tencor
• Model: Surfscan 5500

Good condition KLA-Tencor Surfscan 5500 Test & Measurement (semiconductors)s. Located in USA and other countries. Click request price for more information.