Rudolph Research Auto EL III Ellipsometer
- Manufacturer: Rudolph
- Model: Auto EL-III
The Rudolph Ellipsometer AutoELIII allows measurement of the thickness and refractive index of one or two thin transparent films on a substrate. Features: Internal data reduction software for single and double la...
San Jose, CA
KLA-Tencor SP1-TBI Unpatterned Surface Inspection System
- Manufacturer: KLA-Tencor
- Model: SP1
KLA-Tencor's SP1 configured with KLA-Tencor's Trible-Beam Illumination (TBI). Specifications: Dual Dark Field Collection Channels. Sensitivity 60nm / 0.060µm. 0.001 ppm Haze Sensitivity. Argon Ion Laser (488nm. I...
San Jose, CA
KLA-Tencor SP1 Classic with single 200mm open cassette or single 300mm foup
- Manufacturer: KLA-Tencor
- Model: SP1
300/200mm wafers Dual Dark Field Collection Channels 0.079um Defect Sensitivity 0.001 ppm Haze Sensitivity Argon Ion Laser (488nm) Measurement Chamber with ULPA Filter and Blower Unit Operator Interface : MS Wind...
San Jose, CA
Cascade Probe Card Holder 115-418 for Summit 11XXX and 12XXX series Probers with microchamber
- Manufacturer: Cascade Microtech
- Model: Summit
Cascade Microtechprobe 115-418 card holder for microchamber with clamp holder Back pivoting edge connector Maintains a dark and dry EMI-RFI shielded environment Stable 3 point planarization theta micrometer c...
$3,950 USDSan Jose, CA
Rudolph Research Auto EL IV Ellipsometer
- Manufacturer: Rudolph
- Model: Auto EL-IV
The AutoEl IV has automatic 3 wavelength operation and a scanning stage. Multiple wavelength operation gives this instrument more flexibility for meauring multiple film stacks. The scanning stage allows wafer uni...
San Jose, CA
Nikon NWL860T wafer loader for 150-200mm wafers
- Manufacturer: Nikon
- Model: NWL860
Nikon wafer loader for 150/200mm wafers Prealignment for wafer flat or notch Shuttle stage additional add $4500.
$12,500 USDSan Jose, CA
Nikon Optiphot 150 Inspection Microscope for brightfield, darkfield, and DIC
- Manufacturer: Nikon
- Model: Optiphot 150
Reflected light microscope configured for brightfield, darkfield, and DIC ( Nomarkski) inspection stage has 6x6 xy travel 5 place universal nosepiece CF BD Plan DIC 5x/10x/20x/50x objectives 4 Nomarski prisms...
$8,450 USDSan Jose, CA
KLA-Tencor Surfscan 7600 Particle Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 7600
A particle inspection tool - capable of up to 200mm wafers. Specifications:
San Jose, CA
KLA-Tencor 6100 Surfscan Analysis System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6100
Unpatterned wafer surface contamination analyzer Features: Instantaneous magnified 3-D views of individual defects. Color coded defect maps, histograms, and other graphics. Surface haze detection. Specifications:...
San Jose, CA
KLA-Tencor 6200 Surfscan Analysis System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
Wafer surface contamination analyzer for unpatterned wafers. Features: Instantaneous mangified 3-D views of individual defects Color coded defect maps, histograms, and other graphics Surface haze detection Capabl...
San Jose, CA
Zeiss LM100 Inspection Microscope for wafers up to 450mm or flat panels up to 548mmx548mm with motorized stage, brightfield, darkfield, and Nomarski inspection
- Manufacturer: Zeiss
- Model: LM100
Zeiss inspection microscope for large wafers and panels with reflected and transmitted light Brightfield, darkfield, Nomarski (DIC) inspection Merzhauser motorized xy stage with 550mm x 550mm travel (21.6"x21.6...
$29,500 USDSan Jose, CA
Alessi REL-4100 manual prober with LY1 1064nm laser cutting system
- Manufacturer: Alessi
- Model: REL-4100
Mitutoyo microscope 1064nm pulsed YAG laser Alessi 4100 manual prober with 150mm vacuum chuck and APO 10X objective
$11,500 USDSan Jose, CA
Nikon 200mm wafer inspection station with NWL200-TMB (2012) wafer loader and Eclipse L200 microscope
- Manufacturer: Nikon
- Model: NWL200
Nikon 200mm automated inspection system with Eclipse L200 microscope and Nikon NWL200-TMB wafer loader Topside, Macro, backside inspection modes May be configured for 150mm or 200mm wafers. Â Includes shuttle s...
$85,900 USDSan Jose, CA
Alessi REL4100 manual prober with 150mm vacuum chuck and 6 positioners
- Manufacturer: Alessi
- Model: REL-4100
B&L Microzoome with 4 objectives (May be upgraded to Mitutoyo FS60) add $5500. including 5x/10x/20x/50 objectives 150mm stainless vacuum chuck Microscope XY positioning Manual Platen lift
$9,500 USDSan Jose, CA
Electroglas Xynetics 1034X Wafer Prober with Station
- Manufacturer: Electroglas
- Model: 1034X
This tool is designed to provide a high throughput capacity. It features a temptronics 4 inch thermal Chuck and Miller temperature controller. Features: Temptronics 4-inch Thermal Chuck and Miller Temperature Con...
San Jose, CA
KLA-Tencor Surfscan 5500 Test & Measurement (semiconductors)
- Manufacturer: KLA-Tencor
- Model: Surfscan 5500
Good condition KLA-Tencor Surfscan 5500 Test & Measurement (semiconductors)s. Located in USA and other countries. Click request price for more information.
USA
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