Used Test & Measurement (Semiconductors) in California, USA

KLA-Tencor SP1-TBI Unpatterned Surface Inspection System
- Manufacturer: KLA-Tencor
- Model: SP1
KLA-Tencor's SP1 configured with KLA-Tencor's Trible-Beam Illumination (TBI). Specifications: Dual Dark Field Collection Channels. Sensitivity 60nm / 0.060µm. 0.001 ppm Haze Sensitivity. Argon Ion Laser (488nm. I...
San Jose, CA
KLA-Tencor SP1 Classic with single 200mm open cassette or single 300mm foup
- Manufacturer: KLA-Tencor
- Model: SP1
300/200mm wafers Dual Dark Field Collection Channels 0.079um Defect Sensitivity 0.001 ppm Haze Sensitivity Argon Ion Laser (488nm) Measurement Chamber with ULPA Filter and Blower Unit Operator Interface : MS Wind...
San Jose, CA
Nikon NWL860T wafer loader for 150-200mm wafers
- Manufacturer: Nikon
- Model: NWL860
Nikon wafer loader for 150/200mm wafers Prealignment for wafer flat or notch Shuttle stage additional add $4500.
$12,500 USD
San Jose, CA
Nikon Optiphot 150 Inspection Microscope for brightfield, darkfield, and DIC
- Manufacturer: Nikon
- Model: Optiphot 150
Reflected light microscope configured for brightfield, darkfield, and DIC ( Nomarkski) inspection stage has 6x6 xy travel 5 place universal nosepiece CF BD Plan DIC 5x/10x/20x/50x objectives 4 Nomarski prisms...
$8,450 USD
San Jose, CA
KLA-Tencor Surfscan 7600 Particle Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 7600
A particle inspection tool - capable of up to 200mm wafers. Specifications:
San Jose, CA
KLA-Tencor 6100 Surfscan Analysis System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6100
Unpatterned wafer surface contamination analyzer Features: Instantaneous magnified 3-D views of individual defects. Color coded defect maps, histograms, and other graphics. Surface haze detection. Specifications:...
San Jose, CA
Rudolph Research FE-III Focus Ellipsometer
- Manufacturer: Rudolph
- Model: FE-III
The FE-III has fully automatic operation and a scanning stage. Unique optical and detection systems measure ellipsometric parameters over an angle range of 40 to 70 degrees simultaneously, giving more flexibility...
San Jose, CA
ADE UltraScan 9300 Wafer Inspection System
- Manufacturer: ADE
Non-contact capacitive probe measurement with 10nm resolution, and 400 to 1000 microns wafer thickness range. It is capable of handling 100mm to 200mm wafers. Features: 2 cassette input stations 3 cassette output...
San Jose, CA
Rudolph Research Auto EL III Ellipsometer
- Manufacturer: Rudolph
- Model: Auto EL-III
The Rudolph Ellipsometer AutoELIII allows measurement of the thickness and refractive index of one or two thin transparent films on a substrate. Features: Internal data reduction software for single and double la...
San Jose, CA
Rudolph Research Auto EL IV Ellipsometer
- Manufacturer: Rudolph
- Model: Auto EL-IV
The AutoEl IV has automatic 3 wavelength operation and a scanning stage. Multiple wavelength operation gives this instrument more flexibility for meauring multiple film stacks. The scanning stage allows wafer uni...
San Jose, CA
Rudolph Research FE-IIID Focus Dual Wavelength Ellipsometer
- Manufacturer: Rudolph
The FE III-D's advanced Focused Beam™ system uses dual wavelength technology to directly measure the sample with a small spot at multiple angles of incidence and at multiple wavelengths. This allows the system to...
San Jose, CA
ADE UltraScan 9350 Wafer Inspection / Sorter System
- Manufacturer: ADE
Non-contact capacitive probe measurement with 10nm resolution, 400 to 1000 microns wafer thickness range. Capable of handling 100mm to 200mm wafers Features: 2 cassette input stations, 3 cassette output stations,...
San Jose, CA
KLA Tencor Surfscan SP1-DLS Wafer Surface Analysis System
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
KLA Tencor Surfscan SP1-DLS Wafer Surface Analysis System set up for 200mm Edge Grip Handler. Cassette Open Handler System/SMIF/Dual Cassette. System refurbished to meet OEM Specifications. Features: Includes the...
San Jose, CA
KLA-Tencor 6200 Surfscan Analysis System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
Wafer surface contamination analyzer for unpatterned wafers. Features: Instantaneous mangified 3-D views of individual defects Color coded defect maps, histograms, and other graphics Surface haze detection Capabl...
San Jose, CA
Zeiss LM100 Inspection Microscope for wafers up to 450mm or flat panels up to 548mmx548mm with motorized stage, brightfield, darkfield, and Nomarski inspection
- Manufacturer: Zeiss
- Model: LM100
Zeiss inspection microscope for large wafers and panels with reflected and transmitted light Brightfield, darkfield, Nomarski (DIC) inspection Merzhauser motorized xy stage with 550mm x 550mm travel (21.6"x21.6...
$29,500 USD
San Jose, CA
KLA-Tencor Surfscan 6220 Test & Measurement (semiconductors)
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
Good condition KLA-Tencor Surfscan 6220 Test & Measurement (semiconductors)s manufactured in 1997. Located in USA and other countries. Click request price for more information.
USA