Used Test & Measurement (Semiconductors) in California, USA

Trusted Seller
Nanometrics Nanospec AFT 210
- used
- Manufacturer: Nanometrics
- Model: Nanospec AFT 210
Nanometrics Nanospec AFT 210 (Nanometrics 210) Nanometrics AFT 210* Nanometrics 210 * Film Measurement System * Stage - dual 4" wafers - larger stage can be supplied * Range of Thicknesses: 100 to 500,000 ...
Rocklin, CA
Trusted Seller
Nanometrics Nanospec AFT 4000
- used
- Manufacturer: Nanometrics
- Model: Nanospec AFT 4000
Nanometrics Nanospec AFT 4000 (Nanometrics 4000) Nanometrics Nanoline AFT 4000 * Table top automated film thickness and reflectivity system. * Standard Film Types Measured* Single Layer Films: Visible 500-5...
Rocklin, CA
Trusted Seller
Nikon Optiphot 88 Reflected Light Microscope
- used
- Manufacturer: Nikon
- Model: Optiphot 88
Nikon Optiphot 88 Reflected Light Microscope (HP16) Nikon Optiphot 88 Reflected Light Microscope* Nikon Optiphot 88 Reflected Light 8 inch wafer stand* Nikon EPI Bright Field / Dark Field Vertical Illuminat...
Rocklin, CA
Trusted Seller
Prometrix Model SM200 (SpectroMap)
- used
- Manufacturer: Prometrix
Prometrix Model SM200 (SpectroMap) (Prometrix Model SM-200) Prometrix SM-200 (SpectroMap)* Film Thickness Mapping System
Rocklin, CA
Trusted Seller
Tencor P-2H Profilometer Base Only (with Handler option)
- used
- Manufacturer: KLA-Tencor
Tencor P-2H Profilometer Base Only (with Handler option) (Tencor P-2H Profilometer) Tencor P-2H (Base Only)* This is the "Base and Handler" only for a Tencor P2.
Rocklin, CA
Trusted Seller
Tencor P-2 Profilometer
- used
- Manufacturer: KLA-Tencor
Tencor P-2 Profilometer (Tencor P-2 Profilometer) Tencor P-2 Long Scan Profilometer * Scan Length: 210mm. * Scan Speed: 1 um/sec to 25mm/sec. * Vertical range: +/- 6.5um at 1A resolu...
Rocklin, CA
Trusted Seller
Tencor M-Gage encoder Disks
- used
- Manufacturer: KLA-Tencor
Tencor M-Gage encoder Disks (EQP-10286) * Wafer (All wafer size) Point (1) Available (3ea.) * Wafer ( 50mm) Point (5) Available (5ea.) * Wafer ( 75mm) Point (5) Available (5ea.)* Wafer ( 75mm) Point (9) ...
Rocklin, CA
Trusted Seller
Tencor M-Gage
- used
- Manufacturer: KLA-Tencor
Tencor M-Gage (M-Gage) Tencor M-Gage. Non-Contact Wafer Monitor for Sheet resistance. 115v, 60 hz
Rocklin, CA
Trusted Seller
Nanometrics Nanospec AFT 200
- used
- Manufacturer: Nanometrics
- Model: Nanospec AFT 200
Nanometrics Nanospec AFT 200 (Nanometrics 200) Nanometrics Nanospec AFT 200* Manual system
Rocklin, CA
Trusted Seller
KLA - Tencor UV 1080
- used
- Manufacturer: KLA-Tencor
KLA - Tencor UV 1080 (KLA - Tencor UV 1080) KLA - Tencor UV 1080 * Prometrix UV-1080 * Max wafer capable: 200mm* Intel Pentium III Computer* Windows NT* 2 Open Cassette Stations* Equi...
Rocklin, CA
Trusted Seller
Prometrix VP-10
- used
- Manufacturer: Prometrix
Prometrix VP-10 ( Prometrix VP-10) Prometrix VP-10
Rocklin, CA
Trusted Seller
Prometrix C2C Auto Handler
- used
- Manufacturer: Prometrix
Prometrix C2C Auto Handler (KLA Tencor RS-55) Prometrix C2C Auto Handler
Rocklin, CA
Trusted Seller
KLA 8020 AIT
- used
- Manufacturer: KLA-Tencor
- Model: AIT
KLA 8020 AIT (KLA 8020 AIT) KLA 8020 AIT s/n 0800-824
Rocklin, CA
Trusted Seller
Nikon Optiphot 66 Transmitted and Reflected light microscope system
- used
- Manufacturer: Nikon
- Model: Optiphot 66
Nikon Optiphot 66 Transmitted and Reflected light microscope system (HP11) Nikon Optiphot 66 Transmitted & Reflected Light microscope System
$7,500 USD
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Est. $147/mo
Rocklin, CA
Trusted Seller
Tencor P-2H Profilometer (with Handler option)
- used
- Manufacturer: KLA-Tencor
Tencor P-2H Profilometer (with Handler option) (Tencor P-2H Profilometer) Tencor P-2H Long Scan Profilometer. * Scan Length: 210mm. Scan * Speed: 1 um/sec to 25mm/sec. * Vertical rang...
Rocklin, CA
KLA-Tencor SP1 Test & Measurement (semiconductors)
- used
- Manufacturer: KLA-Tencor
- Model: SP1
Good condition KLA-Tencor SP1 Test & Measurement (semiconductors)s manufactured in 2006. Located in USA and other countries. Click request price for more information.
USA