Used Metrology / Inspection (Semiconductors) in Wexford, Ireland

RUDOLPH FE-VII 200

• used

• Manufacturer: Rudolph

RUDOLPH FE-VII 200 METROLOGY

MAXIM INTEGRATED M310 200

• used

• Manufacturer: Unknown

MAXIM INTEGRATED M310 200 METROLOGY

Rigaku 150 mm FLUORESCENCE MODEL3630

• used

• Manufacturer: Rigaku

Rigaku 150 mm FLUORESCENCE MODEL3630 Metrology

KLA-Tencor 150 mm 5100 TEST SYSTEM

• used

• Manufacturer: KLA-Tencor

KLA-Tencor 150 mm 5100 TEST SYSTEM Metrology

AMAT NanoSEM

• used

• Manufacturer: Amat
• Model: NanoSEM

AMAT NanoSEM CD Metrology 300 mm Vintage 2007

AMAT NanoSEM

• used

• Manufacturer: Amat
• Model: NanoSEM

AMAT NanoSEM CD Metrology 300 mm Vintage 2002

AMAT NanoSEM

• used

• Manufacturer: Amat
• Model: NanoSEM

AMAT NanoSEM CD Metrology 300 mm Vintage 2007

KLA Tencor NA

• used

• Manufacturer: KLA-Tencor

KLA Tencor N/A Films Metrology 200 mm Vintage

ADE Episcan 1000

• used

• Manufacturer: ADE

ADE Episcan 1000 ADE Episcan 1000 Epi Metrology Spectrometer Film Thickness Measurement & Mapping Tool

Hitachi AS5000

• used

• Manufacturer: Hitachi

Hitachi AS5000 Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm Wafer Particle & Defect Analysis system AS5000 Defect data server

KLA-Tencor LMS IPRO5

• used

• Manufacturer: KLA-Tencor

KLA-Tencor LMS IPRO5 KLA-Tencor, LMS IPRO5, Photomask Registration and CD Metrology System KLA-Tencor, IPRO5, Photomask Registration and CD Metrology System 6 by 0.25 inch photomask and EUV masks Dynamic position...

MKS INSTRUMENTS 9330-0155

• used

• Manufacturer: MKS

THERMCO 600400-01

• used

• Manufacturer: Thermco Systems

THERMA WAVE 30-015939

• used

• Manufacturer: Therma-Wave

LAM 853-017932-001

• used

• Manufacturer: Lam Research - Novellus